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Beller, M.M. (author), Zaidman, A.E. (author), Karpov, Andrey (author), Zwaan, Rolf A. (author)
Micro-clones are tiny duplicated pieces of code; they typically comprise only few statements or lines. In this paper, we study the “Last Line Effect,” the phenomenon that the last line or statement in a micro-clone is much more likely to contain an error than the previous lines or statements. We do this by analyzing 219 open source projects and...
journal article 2017