Searched for: subject%3A%22ion%255C+beam%255C+induced%255C+deposition%22
(1 - 4 of 4)
document
Nanda, G. (author), Veldhoven, E. van (author), Maas, D. (author), Herfst, R. (author), Sadeghian Marnani, H. (author), Alkemade, P.F.A. (author)
abstract 2016
document
Maas, D. (author), Van veldhoven, E. (author), Chen, P. (author), Sidorkin, V. (author), Salemink, H. (author), Van der Drift, E. (author), Alkemade, P. (author)
The recently introduced helium ion microscope (HIM) is capable of imaging and fabrication of nanostructures thanks to its sub-nanometer sized ion probe [1,2]. The unique interaction of the helium ions with the sample material provides very localized secondary electron emission, thus providing a valuable signal for high-resolution imaging as well...
conference paper 2010
document
Chen, P. (author)
The direct writing technology known as ion-beam-induced deposition (IBID) has been attracting attention mainly because of its high degree of flexibility of locally prototyping three-dimensional (3D) nanostructures. These high-resolution nanostructures have various research applications. However, no systematic study of the capability of IBID to...
doctoral thesis 2010
document
Maas, D. (author), Van Veldhoven, E. (author), Chen, P. (author), Sidorkin, V. (author), Salemink, H. (author), Van der Drift, E. (author), Alkemade, P. (author)
The recently introduced helium ion microscope (HIM) is capable of imaging and fabrication of nanostructures thanks to its sub-nanometer sized ion probe [1,2]. The unique interaction of the helium ions with the sample material provides very localized secondary electron emission, thus providing a valuable signal for high-resolution imaging as well...
conference paper 2009
Searched for: subject%3A%22ion%255C+beam%255C+induced%255C+deposition%22
(1 - 4 of 4)