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Herzog, Alexander (author), Benkner, Simon (author), Zandi, Babak (author), Buffolo, Matteo (author), van Driel, W.D. (author), Meneghini, Matteo (author), Khanh, Tran Quoc (author)We report on the degradation mechanisms and dynamics of silicone encapsulated ultraviolet A (UV-A) high-power light-emitting diodes (LEDs), with a peak wavelength of 365nm. The stress tests were carried out for a period of 8665 hours with forward currents between 350mA and 700mA and junction temperatures up to 132°C. Depending on stress...journal article 2023
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Benkner, Simon (author), Herzog, Alexander (author), Klir, Stefan (author), van Driel, W.D. (author), Khanh, Tran Quoc (author)The unique radiative, photometric and colorimetric characteristic of a light-emitting diode is derived from its spectral power distribution. Modeling such characteristics with respect to the forward current, temperature or operating time has been subject of various studies. Deriving a simple analytical model, however, is not trivial due to the...journal article 2022
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Herzog, Alexander (author), Wagner, Max (author), Benkner, Simon (author), Zandi, Babak (author), van Driel, W.D. (author), Khanh, Tran Quoc (author)We report on the degradation dynamics and mechanisms of the commercially available chip-on-board (COB) high-power light-emitting diode (LED) modules with an electrical power of 175 W. Due to the associated thermal load, the temperature dependence of the aging processes is additionally analyzed within the scope of this work. The aging tests...journal article 2022