Overweg, H.C. (author), Den Haan, A.M.J. (author), Eerkens, H.J. (author), Alkemade, P.F.A. (author), La Rooij, A.L. (author), Spreeuw, R.J.C. (author), Bossoni, L. (author), Oosterkamp, T.H. (author) We investigate the degradation of the magnetic moment of a 300?nm thick FePt film induced by Focused Ion Beam (FIB) milling. A 1??m?×?8??m rod is milled out of a film by a FIB process and is attached to a cantilever by electron beam induced deposition. Its magnetic moment is determined by frequency-shift cantilever magnetometry. We find that the...
journal article 2015
