Searched for: subject%3A%22microscopy%22
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Botman, A. (author), Hagen, C.W. (author), Li, J. (author), Thiel, B.L. (author), Dunn, K.A. (author), Mulders, J.J.L. (author), Randolph, S. (author), Toth, M. (author)
The material grown in a scanning electron microscope by electron beam-induced deposition (EBID) using Pt(PF3)4 precursor is shown to be electron beam sensitive. The effects of deposition time and postgrowth electron irradiation on the microstructure and resistivity of the deposits were assessed by transmission electron microscopy, selected area...
journal article 2009
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Botman, A. (author), Hesselberth, M. (author), Mulders, J.J.L. (author)
Focused electron-beam-induced deposition (EBID) allows the rapid fabrication of three-dimensional nanodevices and metallic wiring of nanostructures, and is a promising technique for many applications in nanoresearch. The authors present two topics on platinum-containing nanostructures created by EBID. First, they report on a TEM study of the...
journal article 2008
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Khalili Amiri, P. (author), Zhuang, Y. (author), Schellevis, H. (author), Rejaei, B. (author), Vroubel, M. (author), Ma, Y. (author), Burghartz, J.N. (author)
This work presents a series of high-resistivity nanogranular Co–Al–O films with maximum resistivity of ? 110?m??cm. The films were deposited using pulsed dc reactive sputtering of a Co72Al28 target in an oxygen/argon ambient. The samples were characterized by scanning electron microscopy (SEM), M-H loop measurements, and s-parameter measurements...
journal article 2007
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Koleva, D.A. (author), De Wit, J.H.W. (author), Van Breugel, K. (author), Lodhi, Z.F. (author), Van Westing, E. (author)
The electrochemical behavior of steel reinforcement in conditions of corrosion and cathodic protection was studied, using electrochemical impedance spectroscopy (EIS) and compared to reference (noncorroding) conditions. Polarization resistance (PR) method and potentiodynamic polarization (PDP) were employed as well, in addition to ac 2 pin...
journal article 2007
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Van der Zant, H.S.J. (author), Mantel, O.C. (author), Heij, C.P. (author), Dekker, C. (author)
journal article 1997
Searched for: subject%3A%22microscopy%22
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