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Gaitas, A. (author)This dissertation aims to advance the current state of cantilevers with integrated metal thermal and deflection sensing elements. Metallic sensing elements enable the use of alternative substrate materials (such as polymers), that tend to exhibit higher compliance properties and are more robust (less brittle) compared to Si or Si3N4 cantilevers....doctoral thesis 2013
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Gaitas, A. (author), Wolgast, S. (author), Covington, E. (author), Kurdak, C. (author)Measuring the temperature profile of a nanoscale sample using scanning thermal microscopy is challenging due to a scanning probe's non-uniform heating. In order to address this challenge, we have developed a calibration sample consisting of a 1-?m wide gold wire, which can be heated electrically by a small bias current. The Joule heating in the...journal article 2013
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Gaitas, A. (author), Gianchandani, S. (author), Zhu, W. (author)Thermomechanical analysis (TMA) is widely used to characterize materials and determine transition temperatures and thermal expansion coefficients. Atomic-force microscopy (AFM) microcantilevers have been used for TMA. We have developed a micromachined probe that includes two embedded sensors: one for measuring the mechanical movement of the...journal article 2011
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Gaitas, A. (author), Zhu, W. (author), Gulari, N. (author), Covington, E. (author), Kurdak, C. (author)Metal microbolometers, used in scanning thermal microscopy, were microfabricated from <20?nm titanium thin films on SiO2/Si3N4/SiO2 cantilevers. These thin films are near the metal-insulator transition regime such that as the film thickness decreases—the resistance increases and the current-voltage characteristics cross over from sublinear to...journal article 2009