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Adam, A.J.L. (author), Van der Valk, N.C.J. (author), Planken, P.C.M. (author)We present measurements and calculations of the terahertz (THz) electric field measured in the near field of a metal tip used in THz apertureless near-field optical microscopy (THz-ANSOM). An analytical model in which we treat the metal tip as a linear wire antenna allows us to predict almost all of the features observed in the measurements,...journal article 2007
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Righolt, C.H. (author), Mai, S. (author), Van Vliet, L.J. (author), Stallinga, S. (author)The quality of the reconstructed image in structured illumination microscopy (SIM) depends on various aspects of the image filtering process. To optimize the trade-off between resolution and ringing artifacts, which lead to negative intensities, we extend Lukosz-bound filtering to 3D SIM and derive the parametrization of the 3D SIM cut-off. We...journal article 2014
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Copuroglu, O. (author)Plane and crossed polarization are the two standard light modes in polarized light microscopy that are widely used to characterize crystalline and amorphous phases in cement-based materials. However, the use of the crossed polarized light mode has been found to be restrictive for studying birefringent phases quantitatively due to the extinction...journal article 2016
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Rudneva, M. (author), Gao, B. (author), Prins, F. (author), Xu, Q. (author), Van der Zant, H.S.J. (author), Zandbergen, H.W. (author)In situ transmission electron microscopy was performed on the electromigration in platinum (Pt) nanowires (14 nm thick, 200 nm wide, and 300 nm long) with and without feedback control. Using the feedback control mode, symmetric electrodes are obtained and the gap usually forms at the center of the Pt nanowire. Without feedback control,...journal article 2013
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Non-conducting interfaces of LaAlO3/SrTiO3 produced in sputter deposition: The role of stoichiometryDildar, I.M. (author), Boltje, D.B. (author), Hesselberth, M.H.S. (author), Aarts, J. (author), Xu, Q. (author), Zandbergen, H.W. (author), Harkema, S. (author)We have investigated the properties of interfaces between LaAlO3 films grown on SrTiO3 substrates singly terminated by TiO2. We used RF sputtering in a high-pressure oxygen atmosphere. The films are smooth, with flat surfaces. Transmission electron microscopy shows sharp and continuous interfaces with some slight intermixing. The elemental ratio...journal article 2013
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Zhao, Q. (author), Schelen, B. (author), Schouten, R. (author)We have built an all-solid-state camera that is directly modulated at the pixel level for frequency-domain fluorescence lifetime imaging microscopy (FLIM) measurements. This novel camera eliminates the need for an image intensifier through the use of an application-specific charge coupled device design in a frequency-domain FLIM system. The...journal article 2012
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Gaitas, A. (author), Zhu, W. (author), Gulari, N. (author), Covington, E. (author), Kurdak, C. (author)Metal microbolometers, used in scanning thermal microscopy, were microfabricated from <20?nm titanium thin films on SiO2/Si3N4/SiO2 cantilevers. These thin films are near the metal-insulator transition regime such that as the film thickness decreases—the resistance increases and the current-voltage characteristics cross over from sublinear to...journal article 2009
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Gao, J.R. (author), Hajenius, M. (author), Tichelaar, F.D. (author), Klapwijk, T.M. (author), Voronov, B. (author), Grishin, E. (author), Gol'tsman, G. (author), Zorman, C.A. (author), Mehregany, M. (author)The authors have realized NbN (100) nanofilms on a 3C-SiC (100)/Si(100) substrate by dc reactive magnetron sputtering at 800?°C. High-resolution transmission electron microscopy (HRTEM) is used to characterize the films, showing a monocrystalline structure and confirming epitaxial growth on the 3C-SiC layer. A film ranging in thickness from 3.4...journal article 2007
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- Onink, M. (author), Tichelaar, F.D. (author), Brakman, C.M. (author), Mittemeijer, E.J. (author), Van der Zwaag, S. (author) journal article 1995
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Tirumalasetty, G.K. (author), Fang, C.M. (author), Jansen, J. (author), Yokosawa, T. (author), Boeije, M.J.F. (author), Sietsma, J. (author), Van Huis, M.A. (author), Zandbergen, H.W. (author)Chromium (Cr), Manganese (Mn), and Carbon (C) are well known alloying elements used in technologically important alloy steels and advanced high strength steels. It is known that binary CrCx and MnCx carbides can be formed in steels, but in this study we reveal for the first time that Cr and Mn were found combined in novel ternary cementite type ...journal article 2014
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Miwa, J.A. (author), Mol, J.A. (author), Salfi, J. (author), Rogge, S. (author), Simmons, M.Y. (author)Single phosphorus donors in silicon are promising candidates as qubits in the solid state. Here, we present low temperature scanning probe microscopy and spectroscopy measurements of individual phosphorus dopants deliberately placed in p-type silicon ?1?nm below the surface. The ability to image individual dopants combined with scanning...journal article 2013
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Vigueras Guillén, J.P. (author), Sari, B. (author), Goes, S.F. (author), Lemij, Hans G. (author), van Rooij, Jeroen (author), Vermeer, K.A. (author), van Vliet, L.J. (author)Background<br/><br/>Corneal endothelium (CE) images provide valuable clinical information regarding the health state of the cornea. Computation of the clinical morphometric parameters requires the segmentation of endothelial cell images. Current techniques to image the endothelium in vivo deliver low quality images, which makes automatic...journal article 2019
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Hung, S. (author), Llobet Rosell, Arnau (author), Jurriens, Daphne (author), Soloviev, O.A. (author), Kapitein, Lukas C. (author), Grußmayer, K.S. (author), Neukomm, Lukas J. (author), Verhaegen, M.H.G. (author), Smith, C.S. (author)Single-molecule localization microscopy (SMLM) enables the high-resolution visualization of organelle structures and the precise localization of individual proteins. However, the expected resolution is not achieved in tissue as the imaging conditions deteriorate. Sample-induced aberrations distort the point spread function (PSF), and high...journal article 2022
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Wiersma, M.S.J. (author), Heiles, B.G. (author), Kalisvaart, D. (author), Maresca, D. (author), Smith, C.S. (author)Ultrasound localization microscopy (ULM) is a vascular imaging method that provides a 10-fold improvement in resolution compared to ultrasound Doppler imaging. Because typical ULM acquisitions accumulate large numbers of synthetic microbubble (MB) trajectories over hundreds of cardiac cycles, transient hemodynamic variations such as pulsatility...journal article 2022
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Nagalingam, Nagaraj (author), Raghunathan, Aswin (author), Korede, V.B. (author), Overmars, E.F.J. (author), Hung, S. (author), Hartkamp, Remco (author), Padding, J.T. (author), Smith, C.S. (author), Eral, H.B. (author)Optofluidic devices have revolutionized the manipulation and transportation of fluid at smaller length scales ranging from micrometers to millimeters. We describe a dedicated optical setup for studying laser-induced cavitation inside a microchannel. In a typical experiment, we use a tightly focused laser beam to locally evaporate the solution...journal article 2023
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Giasin, Khaled (author), Atif, Muhammad (author), Ma, Yuan (author), Jiang, Chulin (author), Koklu, Ugur (author), Sinke, J. (author)GLARE laminates are multi-layered metal-composite materials created from bonding sheets of metallic alloys with carbon or glass fibre layers. The application of hybrid-conventional machining processes such as ultrasonic-assisted drilling (UAD) is becoming of great interest to the aerospace industry due to its capability in reducing the...journal article 2022
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Gonnissen, J. (author), De Backer, A. (author), den Dekker, A.J. (author), Sijbers, J. (author), Van Aert, S. (author)In the present paper, the optimal detector design is investigated for both detecting and locating light atoms from high resolution scanning transmission electron microscopy (HR STEM) images. The principles of detection theory are used to quantify the probability of error for the detection of light atoms from HR STEM images. To determine the...journal article 2016
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Ioannidou, C. (author), Arechabaleta Guenechea, Z. (author), Rijkenberg, Arjan (author), Dalgliesh, Robert M. (author), van Well, A.A. (author), Offerman, S.E. (author)Nanosteels are used in automotive applications to accomplish resource-efficiency while providing high-tech properties. Quantitative data and further understanding on the precipitation kinetics in Nanosteels can contribute to fulfil this goal. Small-Angle Neutron Scattering measurements are performed on a Fe-C-Mn-V steel, previously heat-treated...journal article 2018
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Chu, L. (author), Korobko, A.V. (author), Cao, A. (author), Sachdeva, S. (author), Liu, Z. (author), de Smet, L.C.P.M. (author), Sudhölter, Ernst J. R. (author), Picken, S.J. (author), Besseling, N.A.M. (author)The Hamaker constant between graphene oxide and silica, which quantifies the strength of van der Waals forces is determined, by mimicking a “vacuum spacer” in an atomic force microscopyforce study. It is demonstrated that, a 2D spacer is expected to yield an accurately defined separation, owing to the high atom density and strength in planar...journal article 2017
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van Kessel, L.C.P.M. (author), Huisman, T.A. (author), Hagen, Cornelis W. (author)Background: Line-edge roughness (LER) is often measured from top-down critical dimension scanning electron microscope (CD-SEM) images. The true three-dimensional roughness profile of the sidewall is typically ignored in such analyses. Aim: We study the response of a CD-SEM to sidewall roughness (SWR) by simulation. Approach: We generate...journal article 2020