Searched for: subject:"microscopy"
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Basak, S. (author)
With the focus in automobile industry to switch from petroleum-based vehicles to all electric vehicles, the increasing demand on harvesting energy from renewable sources for a safer and greener future and the ever-increasing demand of the portable electronics systems, the need for better batteries is eminent. The ultimate aim of battery research...
doctoral thesis 2017
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Gritti, N. (author)
doctoral thesis 2017
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Antolović, I.M. (author), Burri, S. (author), Bruschini, Claudio (author), Hoebe, Ron A. (author), Charbon, E.E.E. (author)
sCMOS imagers are currently utilized (replacing EMCCD imagers) to increase the acquisition speed in super resolution localization microscopy. Single-photon avalanche diode (SPAD) imagers feature frame rates per bit depth comparable to or higher than sCMOS imagers, while generating microsecond 1-bit-frames without readout noise, thus paving...
journal article 2017
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Haring, M.T. (author), Liv Hamarat, N. (author), Zonnevylle, A.C. (author), Narvaez Gonzalez, A.C. (author), Voortman, L.M. (author), Kruit, P. (author), Hoogenboom, J.P. (author)
In the biological sciences, data from fluorescence and electron microscopy is correlated to allow fluorescence biomolecule identification within the cellular ultrastructure and/or ultrastructural analysis following live-cell imaging. High-accuracy (sub-100 nm) image overlay requires the addition of fiducial markers, which makes overlay accuracy...
journal article 2017
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Vicarelli, L. (author)
doctoral thesis 2017
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Palardy, G. (author), Fernandez Villegas, I. (author)
This paper presents a detailed experimental assessment of the effect of the thickness of flat energy directors (ED) on heat generation at the interface during ultrasonic welding. Power and displacement data showed clear differences caused by the change of thickness, related to heat concentration at the weld line during the process. The extent...
journal article 2017
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Bolten, Jens (author), Arat, K.T. (author), Ünal, Nezih (author), Porschatis, Caroline (author), Wahlbrink, Thorsten (author), Lemme, Max C. (author)
In this paper key challenges posed on metrology by feature dimensions of 20nm and below are discussed. In detail, the need for software-based tools for SEM image acquisition and image analysis in environments where CD-SEMs are not available and/or not flexible enough to cover all inspection tasks is outlined. These environments include...
conference paper 2017
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Keyvani Janbahan, A. (author), Alijani, F. (author), Sadeghian, Hamed (author), Maturova, Klara (author), Goosen, J.F.L. (author), van Keulen, A. (author)
This paper investigates the closed-loop dynamics of the Tapping Mode Atomic Force Microscopy using a new mathematical model based on the averaging method in Cartesian coordinates. Experimental and numerical observations show that the emergence of chaos in conventional tapping mode AFM strictly limits the imaging speed. We show that, if the...
journal article 2017
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Yin, L.J. (author), Dierre, B.F.P.R. (author), Sekiguchi, Takashi (author), van Ommen, J.R. (author), Hintzen, H.T.J.M. (author), Cho, Yujin (author)
phosphors has...
journal article 2017
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Chu, L. (author), Korobko, A.V. (author), Cao, A. (author), Sachdeva, S. (author), Liu, Z. (author), de Smet, L.C.P.M. (author), Sudholter, Ernst J. R. (author), Picken, S.J. (author), Besseling, N.A.M. (author)
The Hamaker constant between graphene oxide and silica, which quantifies the strength of van der Waals forces is determined, by mimicking a “vacuum spacer” in an atomic force microscopyforce study. It is demonstrated that, a 2D spacer is expected to yield an accurately defined separation, owing to the high atom density and strength in planar...
journal article 2017
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Ghodrat, S. (author), Riemslag, A.C. (author), Kestens, L.A.I. (author)
Orientation contrast microscopy (i.e., electron backscattered diffraction, EBSD) was employed to monitor the plastic strain in loaded tensile samples of aluminium alloy Al6061 in T4 condition. The kernel average misorientation (KAM) is known to be an appropriate parameter in orientation contrast microscopy which has the potential to characterise...
journal article 2017
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Mulvana, Helen (author), Browning, Richard J. (author), Luan, Ying (author), de Jong, N. (author), Tang, Meng-Xing (author), Eckersley, Robert J. (author), Stride, Eleanor (author)
journal article 2017
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Rull Trinidad, E. (author), Gribnau, T.W. (author), Belardinelli, P. (author), Staufer, U. (author), Alijani, F. (author)
The accuracy of measurements in Amplitude Modulation Atomic Force Microscopy (AFM) is directly related to the geometry of the tip. The AFM tip is characterized by its radius of curvature, which could suffer from alterations due to repetitive mechanical contact with the surface. An estimation of the tip change would allow the user to assess...
journal article 2017
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van Driel, B.A. (author), Wezendonk, T.A. (author), van den Berg, K. J. (author), Kooyman, P.J. (author), Gascon Sabate, J. (author), Dik, J. (author)
-photocatalyzed processes in the paint film, degrading the oil binder into volatile components...
journal article 2017
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van der Walle, P (author), Van Der Donck, J. C.J. (author), Mulckhuyse, W (author), Nijsten, L. (author), Bernal Arango, F.A. (author), De Jong, A. (author), Van Zeijl, E. (author), Spruit, H. E.T. (author), van den Berg, J.H. (author), Nanda, G. (author), van Langen-Suurling, A.K. (author), Alkemade, P.F.A. (author), Pereira, S.F. (author), Maas, D.J. (author)
Particle defects are important contributors to yield loss in semi-conductor manufacturing. Particles need to be detected and characterized in order to determine and eliminate their root cause. We have conceived a process flow for advanced defect classification (ADC) that distinguishes three consecutive steps; detection, review and...
conference paper 2017
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Gonnissen, J (author), De Backer, A (author), den Dekker, A.J. (author), Sijbers, J. (author), Van Aert, S (author)
In this work, a recently developed quantitative approach based on the principles of detection theory is used in order to determine the possibilities and limitations of High Resolution Scanning Transmission Electron Microscopy (HR STEM) and HR TEM for atom-counting. So far, HR STEM has been shown to be an appropriate imaging mode to count the...
journal article 2017
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Norouzi Afshar, F. (author), Tichelaar, F.D. (author), Glenn, A. M. (author), Taheri, P. (author), Sababi, M. (author), Terryn, H.A. (author), Mol, J.M.C. (author)
This work studies the influence of the microstructure on the corrosion mechanism and susceptibility of as-brazed aluminum sheet. Various microstructures are obtained using postbrazing heat treatments developed to enhance the corrosion resistance of an AA4xxx/AA3xxx brazing sheet. The heat treatment results in a decrease of the matrix Si...
journal article 2017
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Konijnenberg, A.P. (author), Coene, W.M.J.M. (author), Urbach, Paul (author)
We report on a novel non-iterative phase retrieval method with which the complex-valued transmission function of an object can be retrieved with a non-iterative computation, with a limited number of intensity measurements. The measurements are taken in either real space or Fourier space, and for each measurement the phase in its dual space is...
journal article 2016
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Bucsa, R.E. (author)
In the DCSC group of Prof. Michel Verhaegen a new type of fluorescence microscope has been developed that relies on adaptive optics to correct for aberrations using optimisation of an image metric. The aim of this thesis is to realise a complete simulation of the optical system, and to test a variety of optimisation algorithms in simulation,...
master thesis 2016
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Ren, Y. (author), Kruit, P. (author)
Our group is developing a multibeam scanning electron microscope (SEM) with 196 beams in order to increase the throughput of SEM. Three imaging systems using, respectively, transmission electron detection, secondary electron detection, and backscatter electron detection are designed in order to make it as versatile as a single beam SEM. This...
journal article 2016
Searched for: subject:"microscopy"
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