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Eroms, J. (author), Van Schaarenburg, L.C. (author), Driessen, E.F.C. (author), Plantenberg, J.H. (author), Huizinga, C.M. (author), Schouten, R.N. (author), Verbruggen, A.H. (author), Harmans, C.J.P.M. (author), Mooij, J.E. (author)The authors have studied low-frequency resistance fluctuations in shadow-evaporated Al/AlOx/Al tunnel junctions. Between 300 and 5?K the spectral density follows a 1/f law. Below 5?K, individual defects distort the 1/f shape of the spectrum. The spectral density decreases linearly with temperature between 150 and 1?K and saturates below 0.8?K....journal article 2006
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Vandersypen, L.M.K. (author), Elzerman, J.M. (author), Schouten, R.N. (author), Willems van Beveren, L.H. (author), Hanson, R. (author), Kouwenhoven, L.P. (author)We observe individual tunnel events of a single electron between a quantum dot and a reservoir, using a nearby quantum point contact (QPC) as a charge meter. The QPC is capacitively coupled to the dot, and the QPC conductance changes by about 1% if the number of electrons on the dot changes by one. The QPC is voltage biased and the current is...journal article 2004
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- Liefrink, F. (author), Scholten, A.J. (author), Dekker, C. (author), Dijkhuis, J.I. (author), Alphenaar, B.W. (author), Van Houten, H. (author), Foxon, C.T. (author) journal article 1992
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- Liefrink, F. (author), Scholten, A.J. (author), Dekker, C. (author), Dijkhuis, J.I. (author), Eppenga, R. (author), Van Houten, H. (author), Foxon, C.T. (author) conference paper 1992