- document
-
Qian, Cheng (author), Fan, Jiajie (author), Fang, Jiayi (author), Yu, Chaohua (author), Ren, Y. (author), Fan, Xuejun (author), Zhang, Kouchi (author)By solving the problem of very long test time on reliability qualification for Light-emitting Diode (LED) products, the accelerated degradation test with a thermal overstress at a proper range is regarded as a promising and effective approach. For a comprehensive survey of the application of step-stress accelerated degradation test (SSADT) in...journal article 2017
- document
-
Tang, H. (author), Ye, H. (author), Wong, K.Y. (author), Leung, Stanley Y.Y. (author), Fan, Jiajie (author), Chen, Xianping (author), Fan, Xuejun (author), Zhang, Kouchi (author)The objective of this study is to quantitatively evaluate the impacts of LED components on the overdriving reliability of high power white LED chip scale packages (CSPs). The reliability tests under room temperature are conducted over 1000 h in this study on CSP LEDs with overdriving currents. A novel method is proposed to investigate the...journal article 2017