Searched for: subject%3A%22predictive%22
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Guerra, Victor (author), Hamon, Benoit (author), Bataillou, Benoit (author), Inamdar, A.S. (author), van Driel, W.D. (author)
This paper introduces an ontology-based Digital Twin (DT) architecture for the lighting industry, integrating simulation models, data analytics, and visualization to represent luminaires. The ontology standardizes luminaire components, facilitating interoperability with design tools. The calculated ontology-level metrics suggest mid-level...
journal article 2024
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Rocchetta, Roberto (author), Zhan, Zhouzhao (author), van Driel, W.D. (author), Di Bucchianico, Alessandro (author)
Lifetime analyses are crucial for ensuring the durability of new Light-emitting Diodes (LEDs) and uncertainty quantification (UQ) is necessary to quantify a lack of usable failure and degradation data. This work presents a new framework for predicting the lifetime of LEDs in terms of lumen maintenance, effectively quantifying the natural...
journal article 2024
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Herzog, Alexander (author), Benkner, Simon (author), Zandi, Babak (author), Buffolo, Matteo (author), van Driel, W.D. (author), Meneghini, Matteo (author), Khanh, Tran Quoc (author)
We report on the degradation mechanisms and dynamics of silicone encapsulated ultraviolet A (UV-A) high-power light-emitting diodes (LEDs), with a peak wavelength of 365nm. The stress tests were carried out for a period of 8665 hours with forward currents between 350mA and 700mA and junction temperatures up to 132°C. Depending on stress...
journal article 2023
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Ibrahim, Mesfin Seid (author), Fan, J. (author), Yung, Winco K.C. (author), Jing, Zhou (author), Fan, Xuejun (author), van Driel, W.D. (author), Zhang, Kouchi (author)
The increased system complexity in electronic products brings challenges in a system level reliability assessment and lifetime estimation. Traditionally, the graph model-based reliability block diagrams (RBD) and fault tree analysis (FTA) have been used to assess the reliability of products and systems. However, these methods are based on...
journal article 2021
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Sun, Bo (author), Fan, Xuejun (author), van Driel, W.D. (author), Cui, Chengqiang (author), Zhang, Kouchi (author)
In this study, we present a general methodology that combines the reliability theory with physics of failure for reliability prediction of an LED driver. More specifically, an integrated LED lamp, which includes an LED light source with statistical distribution of luminous flux, and a driver with a few critical components, is considered. The...
journal article 2018
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Sun, B. (author), Fan, Xuejun (author), Ye, H. (author), Fan, Jiajie (author), Qian, Cheng (author), van Driel, W.D. (author), Zhang, Kouchi (author)
In this paper, an integrated LED lamp with an electrolytic capacitor-free driver is considered to study the coupling effects of both LED and driver's degradations on lamp's lifetime. An electrolytic capacitor-less buck-boost driver is used. The physics of failure (PoF) based electronic thermal simulation is carried out to simulate the lamp's...
journal article 2017
Searched for: subject%3A%22predictive%22
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