"uuid","repository link","title","author","contributor","publication year","abstract","subject topic","language","publication type","publisher","isbn","issn","patent","patent status","bibliographic note","access restriction","embargo date","faculty","department","research group","programme","project","coordinates"
"uuid:105c83ec-6c79-4296-9ddb-2b49128dc0f1","http://resolver.tudelft.nl/uuid:105c83ec-6c79-4296-9ddb-2b49128dc0f1","Magnetic field effects on switching noise in a quantum point contact","Liefrink, F.; Scholten, A.J.; Dekker, C.; Dijkhuis, J.I.; Alphenaar, B.W.; Van Houten, H.; Foxon, C.T.","","1992","","A7220M Galvanomagnetic and other magnetotransport effects semiconductors/insulators; A7270 Noise processes and phenomena in electronic transport; A7320A Surface states, band structure, electron density of states; A7340L Electrical properties of semiconductor to semiconductor contacts, p n junctions, and heterojunctions; aluminium compounds; conduction band; conduction band bottom; conduction bands; fluctuations; g factor; GaAs Al sub x Ga sub 1 x As; gallium arsenide; III V semiconductors; INSPEC; interface electron states; Lande g factor; magnetic field; magnetic field effects; model; noise; point contacts; quantum Hall effect; quantum Hall regime; quantum point contact; quantum size effect; random noise; semiconductor; size effect; switching noise; temporal electrostatic fluctuations; transconductance; zero magnetic field","en","journal article","","","","","","","","","","","","","",""
"uuid:e6cedfe5-c16c-476b-a377-7194db11054f","http://resolver.tudelft.nl/uuid:e6cedfe5-c16c-476b-a377-7194db11054f","Low-frequency noise in quantum point contacts","Liefrink, F.; Scholten, A.J.; Dekker, C.; Dijkhuis, J.I.; Eppenga, R.; Van Houten, H.; Foxon, C.T.","","1992","","A7270 Noise processes and phenomena in electronic transport; A7340L Electrical properties of semiconductor to semiconductor contacts, p n junctions, and heterojunctions; aluminium compounds; B2530B Semiconductor junctions; electron traps; electrostatic potential; fluctuations; GaAs Al sub x Ga sub 1 x As; gallium arsenide; III V semiconductors; INSPEC; low frequency noise; noise; point contacts; quantum point contact; quantum point contacts; resistance; resistance noise; single electron trap; trapped electron","en","conference paper","IOS Press","","","","","","","","","","","","",""
"uuid:67408fa6-8c22-4586-95b4-9a73322605ee","http://resolver.tudelft.nl/uuid:67408fa6-8c22-4586-95b4-9a73322605ee","Low-frequency noise of quantum point contacts in the ballistic and quantum Hall regime","Liefrink, F.; Scholten, A.J.; Dekker, C.; Eppenga, R.; Van Houten, H.; Foxon, C.T.","","1991","","A7220M Galvanomagnetic and other magnetotransport effects semiconductors/insulators; A7270 Noise processes and phenomena in electronic transport; A7335 Mesoscopic systems and quantum interference; backscattering; ballistic regime; conductance; electrostatic potential; fluctuations; INSPEC; low frequency noise; magnetic field; noise; point contacts; quantum Hall effect; quantum Hall regime; quantum interference phenomena; quantum point contact; quantum point contacts; resistance; resistance noise; spin degeneracy; strong magnetic field","en","journal article","","","","","","","","","","","","","",""
"uuid:06a694bc-6bdc-4bf3-9014-8eeac94a7623","http://resolver.tudelft.nl/uuid:06a694bc-6bdc-4bf3-9014-8eeac94a7623","Spontaneous resistance switching and low-frequency noise in quantum point contacts","Dekker, C.; Scholten, A.J.; Liefrink, F.; Eppenga, R.; Van Houten, H.; Foxon, C.T.","","1991","","A7220J Charge carriers: generation, recombination, lifetime, and trapping semiconductors/insulators; A7270 Noise processes and phenomena in electronic transport; A7320D Electron states in low dimensional structures; A7340L Electrical properties of semiconductor to semiconductor contacts, p n junctions, and heterojunctions; carrier mobility; charge transport; conductance; electron device noise; electron traps; electrostatic potential; frequency dependence; INSPEC; local electrostatic potential; low frequency noise; low frequency noise spectroscopy; model; noise; point contacts; quantum point contact; quantum point contacts; quantum size effect; resistance; resistance switching; semiconductor quantum dots; semiconductors; size effect; spectral density; temperature dependence; transport; trapping; white noise","en","journal article","","","","","","","","","","","","","",""