Searched for: subject%3A%22scanning%255C%252Belectron%255C%252Bmicroscopy%22
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Ioannidou, C. (author), Arechabaleta Guenechea, Z. (author), Rijkenberg, Arjan (author), Dalgliesh, Robert M. (author), van Well, A.A. (author), Offerman, S.E. (author)
Nanosteels are used in automotive applications to accomplish resource-efficiency while providing high-tech properties. Quantitative data and further understanding on the precipitation kinetics in Nanosteels can contribute to fulfil this goal. Small-Angle Neutron Scattering measurements are performed on a Fe-C-Mn-V steel, previously heat-treated...
journal article 2018
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Bolten, Jens (author), Arat, K.T. (author), Ünal, Nezih (author), Porschatis, Caroline (author), Wahlbrink, Thorsten (author), Lemme, Max C. (author)
In this paper key challenges posed on metrology by feature dimensions of 20nm and below are discussed. In detail, the need for software-based tools for SEM image acquisition and image analysis in environments where CD-SEMs are not available and/or not flexible enough to cover all inspection tasks is outlined. These environments include...
conference paper 2017
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Sakic, A. (author)
doctoral thesis 2012