Optical STEM detection for scanning electron microscopy

Recent advances in electron microscopy techniques have led to a significant scale up in volumetric imaging of biological tissue. The throughput of electron microscopes, however, remains a limiting factor for the volume that can be imaged in high resolution within reasonable time. Faster detection methods will improve throughput. Here, we have...

Machining GLARE fibre metal laminates: a comparative study on drilling effect between conventional and ultrasonic-assisted drilling

GLARE laminates are multi-layered metal-composite materials created from bonding sheets of metallic alloys with carbon or glass fibre layers. The application of hybrid-conventional machining processes such as ultrasonic-assisted drilling (UAD) is becoming of great interest to the aerospace industry due to its capability in reducing the...

Temperature dependency of the toughening capability of electrospun PA66 nanofibers for carbon/epoxy laminates

The present study evaluates the toughening capability of electrospun PA66 nanofibers for carbon/epoxy composite laminates subjected to mode II loading conditions at elevated temperatures. The Dynamic Mechanical Analysis (DMA) test showed that the glass transition temperature of the produced nanofibers is in a range of ∼60–80 °C. Accordingly,...

Combined focused electron beam-induced deposition and etching for the patterning of dense lines without interconnecting material

High resolution dense lines patterned by focused electron beam-induced deposition (FEBID) have been demonstrated to be promising for lithography. One of the challenges is the presence of interconnecting material, which is often carbonaceous, between the lines as a result of the Gaussian line profile. We demonstrate the use of focused electron...

Understanding the influence of 3D sidewall roughness on observed line-edge roughness in scanning electron microscopy images

Line-edge roughness (LER) is often measured from top-down critical dimension scanning electron microscope (CD-SEM) images. The true three-dimensional roughness profile of the sidewall is typically ignored in such analyses. We study the response of a CD-SEM to sidewall roughness (SWR) by simulation. We generate random rough lines and spaces,...

Beam displacement and blur caused by fast electron beam deflection

Electrostatic beam blankers are an alternative to photo-emission sources for generating pulsed electron beams for Time-resolved Cathodoluminescence and Ultrafast Electron Microscopy. While the properties of beam blankers have been extensively investigated in the past for applications in lithography, characteristics such as the influence of...

Surface effects in simulations of scanning electron microscopy images

We have investigated the contributions of surface effects to Monte Carlo simulations of top-down scanning electron microscopy (SEM) images. The elastic and inelastic scattering mechanisms in typical simulations assume that the electron is deep in the bulk of the material. In this work, we correct the inelastic model for surface effects. We...

Transmission electron imaging in the Delft multibeam scanning electron microscope 1

Our group is developing a multibeam scanning electron microscope (SEM) with 196 beams in order to increase the throughput of SEM. Three imaging systems using, respectively, transmission electron detection, secondary electron detection, and backscatter electron detection are designed in order to make it as versatile as a single beam SEM. This...

Sensitivity of secondary electron yields and SEM images to scattering parameters in MC simulations

In the simulation of secondary electron yields (SEY) and secondary electron microscopy (SEM) images, there is always the question: are we using the correct scattering cross-sections?. The three scattering processes of interest are quasi-elastic phonon scattering, elastic Mott scattering and inelastic scattering using the dielectric function...