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de Voogd, J. M. (author), van Spronsen, M. A. (author), Kalff, F.E. (author), Bryant, B.E.M. (author), Ostojić, O. (author), den Haan, A. M.J. (author), Groot, I.M.N. (author), Oosterkamp, T. H. (author), Otte, A. F. (author), Rost, M. J. (author)Within the last three decades Scanning Probe Microscopy has been developed to a powerful tool for measuring surfaces and their properties on an atomic scale such that users can be found nowadays not only in academia but also in industry. This development is still pushed further by researchers, who continuously exploit new possibilities of...journal article 2017