Searched for: subject:"superconducting%5C+thin%5C+films"
(1 - 14 of 14)
document
Bos, Boy Gustaaf Cornelis (author), Thoen, D.J. (author), Haalebos, E.A.F. (author), Gimbel, P. M.L. (author), Klapwijk, T.M. (author), Baselmans, J.J.A. (author), Endo, A. (author)
The superconducting critical temperature (T-\mathrm{c} > 15 K) of niobium titanium nitride (NbTiN) thin films allows for low-loss circuits up to 1.1 THz, enabling on-chip spectroscopy and multipixel imaging with advanced detectors. The drive for large-scale detector microchips is demanding NbTiN films with uniform properties over an...
journal article 2017
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Diener, P. (author), Schellevis, H. (author), Baselmans, J.J.A. (author)
The low frequency complex impedance of a high resistivity 92?????cm and 100?nm thick TiN superconducting film has been measured via the transmission of several high sensitivity GHz microresonators, down to TC/50. The temperature dependence of the kinetic inductance follows closely BCS local electrodynamics, with one well defined superconducting...
journal article 2012
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Barends, R. (author), Hortensius, H.L. (author), Zijlstra, T. (author), Baselmans, J.J.A. (author), Yates, S.J.C. (author), Gao, J.R. (author), Klapwijk, T.M. (author)
We study NbTiN resonators by measurements of the temperature dependent resonance frequency and frequency noise. Additionally, resonators are studied covered with SiOx dielectric layers of various thicknesses. The resonance frequency develops a nonmonotonic temperature dependence with increasing SiOx layer thickness. The increase in the noise is...
journal article 2008
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Gao, J.R. (author), Hajenius, M. (author), Tichelaar, F.D. (author), Klapwijk, T.M. (author), Voronov, B. (author), Grishin, E. (author), Gol'tsman, G. (author), Zorman, C.A. (author), Mehregany, M. (author)
The authors have realized NbN (100) nanofilms on a 3C-SiC (100)/Si(100) substrate by dc reactive magnetron sputtering at 800?°C. High-resolution transmission electron microscopy (HRTEM) is used to characterize the films, showing a monocrystalline structure and confirming epitaxial growth on the 3C-SiC layer. A film ranging in thickness from 3.4...
journal article 2007
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Kooi, J.W. (author), Baselmans, J.J.A. (author), Hajenius, M. (author), Gao, J.R. (author), Klapwijk, T.M. (author), Dieleman, P. (author), Baryshev, A. (author), De Lange, G. (author)
The intermediate frequency (IF) characteristics, the frequency dependent IF impedance, and the mixer conversion gain of a small area hot electron bolometer (HEB) have been measured and modeled. The device used is a twin slot antenna coupled NbN HEB mixer with a bridge area of 1×0.15??m2, and a critical temperature of 8.3?K. In the experiment the...
journal article 2007
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Barends, R. (author), Hajenius, M. (author), Gao, J.R. (author), Klapwijk, T.M. (author)
We present a description of the current-voltage characteristics of hot electron bolometers in terms of the current-dependent intrinsic resistive transition of NbN films. We find that, by including this current dependence, we can correctly predict the complete current-voltage characteristics, showing excellent agreement with measurements for both...
journal article 2005
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Pedarnig, J.D. (author), Rössler, R. (author), Delamare, M.P. (author), Lang, W. (author), Bäuerle, D. (author), Köhler, A. (author), Zandbergen, H.W. (author)
Vicinal YBa2Cu3O7?? (YBCO) thin films of thickness h = 20–480?nm are grown by pulsed-laser deposition on 10° miscut (001) SrTiO3 substrates. The anisotropic resistivities, c-axis texture, and critical temperature drastically depend on the thickness of vicinal films. High-resolution electron microscopy reveals a defect microstructure with strong...
journal article 2002
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Woeltgens, P.J.M. (author), Dekker, C. (author), Koch, R.H. (author), Hussey, B.W. (author), Gupta, A. (author)
journal article 1994
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Woeltgens, P.J.M. (author), Dekker, C. (author), De Wijn, H.W. (author)
journal article 1993
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Woeltgens, P.J.M. (author), Dekker, C. (author), Swuste, J. (author), De Wijn, H.W. (author)
journal article 1993
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Dekker, C. (author), Eidelloth, W. (author), Koch, R.H. (author)
journal article 1993
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Woeltgens, P.J.M. (author), Dekker, C. (author), Gielkens, S.W.A. (author), De Wijn, H.W. (author)
conference paper 1993
document
Dekker, C. (author), Woeltgens, P.J.M. (author), Koch, R.H. (author), Hussey, B.W. (author), Gupta, A. (author)
journal article 1992
document
Dekker, C. (author), Eidelloth, W. (author), Koch, R.H. (author)
journal article 1992
Searched for: subject:"superconducting%5C+thin%5C+films"
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