Searched for: subject%3A%22transmission%255C%252Belectron%255C%252Bmicroscopy%22
(1 - 3 of 3)
- document
-
Gonnissen, J. (author), De Backer, A. (author), den Dekker, A.J. (author), Sijbers, J. (author), Van Aert, S. (author)In this work, a recently developed quantitative approach based on the principles of detection theory is used in order to determine the possibilities and limitations of High Resolution Scanning Transmission Electron Microscopy (HR STEM) and HR TEM for atom-counting. So far, HR STEM has been shown to be an appropriate imaging mode to count the...journal article 2017
- document
-
Gonnissen, J. (author), De Backer, A. (author), den Dekker, A.J. (author), Sijbers, J. (author), Van Aert, S. (author)In the present paper, the optimal detector design is investigated for both detecting and locating light atoms from high resolution scanning transmission electron microscopy (HR STEM) images. The principles of detection theory are used to quantify the probability of error for the detection of light atoms from HR STEM images. To determine the...journal article 2016
- document
-
Van Aert, Sandra (author), De Backer, Annick (author), Martinez, Gerardo T. (author), den Dekker, A.J. (author), Van Dyck, Dirk (author), Bals, Sara (author), Van Tendeloo, Gustaaf (author)The increasing need for precise determination of the atomic arrangement of non-periodic structures in materials design and the control of nanostructures explains the growing interest in quantitative transmission electron microscopy. The aim is to extract precise and accurate numbers for unknown structure parameters including atomic positions,...journal article 2016