Reduced Calibration Error Employing Parametrized EM models and DC Load Extraction

In this contribution we present an approach to reduce the error arising from the variations of the lumped load, due to process spread, in probe level calibrations. First, full-wave electromagnetic (EM) simulations are employed to generate the nominal standard responses, then a parametric EM simulation of the load structure is used to generate a...

A Rigorous Analysis of the Random Noise in Reflection Coefficients Synthesized via Mixed-Signal Active Tuners

In this contribution, we present a rigorous analysis based on uncertainty propagation techniques to estimate the random variation of the controlled reflection coefficient in mixed-signal load-pull test benches. A digital-to-analog converter is commonly used in these test benches to generate the baseband signal required to synthesize the high...

Noise Behavior and Implementation of Interferometer-Based Broadband VNA

This paper analyzes and accurately models the complex noise behavior of vector network analyzers (VNAs) when measuring large-mismatch devices and subsequently shows how the VNA measurement noise performance is enhanced through implementation of a high-speed, broadband, active RF interferometer module. The presented VNA noise model provides a...

Millimeter-Wave On-Wafer TRL Calibration Employing 3-D EM Simulation-Based Characteristic Impedance Extraction

In this paper, we propose a method based on 3-D electromagnetic simulations, for the characteristic impedance extraction of transmission lines employed in TRL calibration, focusing on lines integrated in silicon technologies. The accuracy achieved with TRL calibrations using the proposed characteristic impedance extraction is benchmarked...