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Ramanandan, G.K.P. (author), Ramakrishnan, G. (author), Planken, P.C.M. (author)
Terahertz (THz) transmission spectroscopy is used to measure the oxidation kinetics of copper thin films evaporated on silicon substrates. The transmission of broadband THz pulses from 1 to 7 THz through the copper film is measured while it gets oxidized at an elevated temperature in ambient air. The change in the transmitted THz electric field...
journal article 2012