CK

C. Kwakernaak

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90 records found

Authored

Analysis of segregation of alloy elements at grain boundaries in tempered steels using Electron Probe X-ray Micro-Analysis
Report (2002) - C. Kwakernaak, W.G. Sloof

Scanning electron microscopy and X-ray micro-analysis of the interface between Zeolite-A and Zeolite-B
Report (2002) - C. Kwakernaak, W.G. Sloof

Determination of X-ray spectra and the environmental friendly soldering alloys using Energy Dispersive Spectroscopy (EDS)
Report (2002) - C. Kwakernaak, W.G. Sloof

Intergranular Attack at Fusion Zone of Nd: YAG laser-welded Galvanized Steels

Determination of the nature of possible surface contamination on nitrided silicon wafers using X-ray microanalysis
Report (2002) - C. Kwakernaak, W.G. Sloof

Determination of the composition of intermetallics in plain and welded 7075 aluminium alloys using Electron Probe X-ray Micro-Analysis (EPMA)
Report (2002) - C. Kwakernaak, W.G. Sloof

Determination of the composition of nitrided surface layers of X38CrMoV5-1 steel samples using Electron Probe X-ray Micro-Analysis
Report (2002) - C. Kwakernaak

X-ray spectra and determination of the composition of surface features in and adjacent to the welding pools of two types of zinc coated steels using Electron Probe X-ray Micro Analysis (EPMA) employing Energy Dispersive Spectroscopy (EDS)
Report (2002) - C. Kwakernaak, W.G. Sloof

Determination of the composition of chromium nitride layers on steel using Electron Probe X-ray Micro-Analysis (EPMA)
Report (2002) - C. Kwakernaak, W.G. Sloof

Determination of composition of PVD formed chromium nitride layers using Electron Probe X-ray Micro-Analysis
Report (2002) - C. Kwakernaak, W.G. Sloof

Scanning electron microscopy Energy Dispersive Spectroscopy on particles in an alloy matrix
Report (2002) - C. Kwakernaak, W.G. Sloof

Bright plasma nitriding of steel with several alloying elements

Analysis Raster Elektronen Microscopie aan een gebroken lasverbinding
Report (2002) - C. Kwakernaak

The dependence of composition and mechanical properties of CrNx coatings on applied bias voltage.

Determination of the Si distribution in the grains of Al-Si alloys using Electron Probe X-ray Micro-Analysis
Report (2002) - C. Kwakernaak, W.G. Sloof

Determination of the composition of laser welded joint of aluminium and iron using Electron Probe X-ray Micro-Analyse (EPMA)
Report (2002) - C. Kwakernaak, W.G. Sloof

Determination of the composition of nitrided surface layers of X38CrMoV5-1 steel samples using Electron Probe X-ray Microanalysis
Report (2002) - C. Kwakernaak

Long time X-ray conting stability measurements of the JEOL JXA 8900R. Analasys Report.
Report (2001) - C. Kwakernaak

Mechanical and structural properties of in-situ doped PECVD SiC layers for post-processing surface micromachining.

Determination of the Mass coverage of ZnNi layers using Electron probe X-ray microanalysis.
Report (2000) - C. Kwakernaak, W.G. Sloof