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S
S van Aert
25 records found
1
2
Authored
Physical limits on atomic resolution
Journal article (2004) -
D Van Dyck
,
S van Aert
,
A.J. den Dekker
How to optimize the experimental design of quantitative atomic resolution TEM experiments?
Journal article (2004) -
S van Aert
,
A.J. den Dekker
,
D Van Dyck
Statistical experimental design for quantitative atomic resolution transmission electron microscopy
Journal article (2004) -
S van Aert
,
A.J. den Dekker
,
A van den Bos
,
D Van Dyck
Optimization of the experimental design of quantitative atomic resolution transmisson electron microscopy experiments
Conference paper (2004) -
S van Aert
,
A.J. den Dekker
,
D Van Dyck
Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures ?
Journal article (2003) -
D Van Dyck
,
S van Aert
,
A.J. den Dekker
,
A van den Bos
Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis
Journal article (2003) -
A Rosenauer
,
D Gerthsen
,
S van Aert
,
D Van Dyck
,
A.J. den Dekker
Statistical Experimental Design for Quantitative Atomic Resolution Transmission Electron Microscopy
Doctoral thesis (2003) -
S van Aert
Optimal experimental design of STEM measurement of atom column positions
Journal article (2002) -
S van Aert
,
A.J. den Dekker
,
D Van Dyck
,
A van den Bos
High-resolution electron microscopy and electron tomography: resolution versus precision
Journal article (2002) -
S van Aert
,
A.J. den Dekker
,
D Van Dyck
,
A van den Bos
Quantitative high resolution electron microscopy and Fisher information
Conference paper (2002) -
A.J. den Dekker
,
S van Aert
High-Resolution Electron Microscopy: From Imaging Toward Measuring
Journal article (2002) -
S van Aert
,
A.J. den Dekker
,
A van den Bos
,
D Van Dyck
How to select the items for the shopping list of future high resolution electron microscopists
Conference paper (2002) -
D Van Dyck
,
S van Aert
,
A.J. den Dekker
,
A van den Bos
The benefits of statistical experimental design for quantitative electron microscopy
Conference paper (2002) -
S van Aert
,
A.J. den Dekker
,
A van den Bos
,
D Van Dyck
High Resolution Electron Microscopy: From Imaging Towards Measuring.
Conference paper (2001) -
S van Aert
,
A.J. den Dekker
,
A van den Bos
,
D Van Dyck
Do smaller probes in a STEM result in more precise measurement of the distances between atom column?
Journal article (2001) -
S van Aert
,
D Van Dyck
Does a monochromator improve the precision in quantitative HRTEM?
Journal article (2001) -
A.J. den Dekker
,
S van Aert
,
D Van Dyck
,
A van den Bos
,
P Geuens
A quantitative evaluation of different STEM imaging modes.
Conference paper (2000) -
A.J. den Dekker
,
S van Aert
,
D Van Dyck
,
A van den Bos
Quantitative ADF STEM: guidelines towards an inmproved experimental design.
Conference paper (2000) -
S van Aert
,
D Van Dyck
,
A.J. den Dekker
,
A van den Bos
Design aspects for an optimum DF STEM probe.
Conference paper (2000) -
S van Aert
,
A.J. den Dekker
,
D Van Dyck
,
A van den Bos
Does a monochromator improve the precision in quantitative HRTEM?
Conference paper (2000) -
A.J. den Dekker
,
S van Aert
,
D Van Dyck
,
A van den Bos
,
P Geuens