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Addition of different contributions to the charged particle probe size

Journal article (1996) - JE Barth, P. Kruit

Standing wave illumination for superresolution analytical electron microscopy

Conference paper (1996) - BM Mertens, AH Buist, P. Kruit

Electron Microscopy in the Netherlands

Journal article (1996) - P. Kruit, FW Schapink, JW Geus, AJ Verkleij, CE Hulstaert

A combined objective lens for electrons and ions

Journal article (1996) - PWH Jager, MCW Kelder, P. Kruit

Coulomb interactions in the Philips XL-FEG

Report (1996) - JE Barth, XR Xiang, MD Nijkerk, GH Jansen, P. Kruit

Throughput in ion beam projection lithography

Report (1996) - JE Barth, P. Kruit

3D Electronic microscopy with standing electron wave illumination

Conference paper (1996) - AH Buist, P. Kruit, BM Mertens

Analytical Electron Microscopy by scanning in Fourier space

Conference paper (1996) - BM Mertens, P. Kruit

A novel low-voltage ballistic-electron-emission-source

Conference paper (1996) - C.W. Hagen, GPEM van Bakel, EG Borgonjen, P. Kruit, VV Kazmiruk, VA Kudryoshov

A Piezo-driven TEM-stage with subnanometer position stability

Conference paper (1996) - BM Mertens, H van der Wulp, HF van Beek, P. Kruit

Combined calculation of lens aberrations, space charge aberrations and statistical Coulomb effects in charged particle optical columns

Journal article (1996) - XR Jiang, JE Barth, P. Kruit

Optical design of a combined ion and electron beam system for nanotechnology

Journal article (1996) - PWH Jager, P. Kruit

Comparison between different imaging modes in focussed ion beam instruments

Journal article (1996) - XR Jiang, P. Kruit

A crystal beam splitter for electron holography

Conference paper (1996) - RM van Dijk, BM Mertens, P. Kruit

Interactive design of multi component systems

Conference paper (1996) - MAJ van der Stam, JE Barth, P. Kruit

Influence of Coulomb interactions on choice of magnification, aperture size and source brightness in a two lens focused ion beam column

Journal article (1996) - P. Kruit, XR Jiang

Auger Spectroscopy in the TEM/STEM

Conference paper (1996) - HFC Hoevers, JS Faber, P. Kruit

Characterization of ultrasharp field emitters by projection microscopy

Journal article (1996) - MJ Fransen, EPN Damen, C Schiller, TL van Rooy, HB Groen, P. Kruit

The influence of ion beam parameters on pattern resolution

Journal article (1996) - PWH Jager, C.W. Hagen, P. Kruit

Differential phase contrast in TEM

Journal article (1996) - MR McCartney, P. Kruit, AH Buist, MR Scheinfein

P. Kruit

Authored