HZ

H.W. Zandbergen

420 records found

Authored

Surface resistance and structure of LuBa2Cu3O7-d superconducting films prepared by MOCVD.

Application of Ramon spectrometry for the characterization of complexed oxide thin films grown by MOCVD.

Imaging of symmetry-forbidden fringes with La(1-x)CaxMnO3 as example.
Journal article (1999) - H.W. Zandbergen, J. Jansen

Critical current density in highly biaxially-oriented YBCO films: can we control Jc(77 K) and optimize up to more than 10^6 Amp/cm^2?

Structure determinations of very small superconducting crystals using electron diffraction.
Journal article (1999) - H.W. Zandbergen, E Connolly, J. Jansen

Molecular sieve MCM-41: A transmission electron microscopy study.
Conference paper (1998) - P.J. Kooyman, H.W. Zandbergen, KR Kloetstra, H van Bekkum

Who is afraid of dynamic diffraction.
Conference paper (1998) - H.W. Zandbergen, J. Jansen, D van Dijk

MSLS, a least-squares procedure for accurate crystal structure.
Journal article (1998) - J. Jansen, D Tang, H.W. Zandbergen, H Schenk

Through focus exit wave reconstruction of intermetallic superconductors.
Conference paper (1998) - H.W. Zandbergen, D Tang, J. Jansen

Disorder effects in epitaxial thin films of (La, Ca)MnO3.
Journal article (1998) - J. Aarts, S Freisem, RWA Hendrikx, H.W. Zandbergen

The determination of specimen orientation and thickness on a nanometer scale from exit waves.
Conference paper (1998) - R.M.J. Bokel, J. Jansen, H.W. Zandbergen, D Van Dyck

HRTEM-exit-wave reconstruction of zeolite.
Book chapter (1998) - P.J. Kooyman, H.W. Zandbergen

The evolution of surface species in NiW/Al2O3 catalysts in various stages of sulfiding: A quasi in-situ high resolution transmission electron microscopic investigation.

The use of phase and amplitude information of reconstructed exit waves.
Conference paper (1998) - H.W. Zandbergen

The crystal structure of the beta"phase in Al-Mg-Si alloys

Accurate determination of crystal structures using electron diffraction data.
Conference paper (1998) - J. Jansen, D Tang, H.W. Zandbergen, H Schenk

Flux-pinning enhancement by Ti induced defects in Bi2Sr2CaCu2O8+delta.
Conference paper (1998) - C. Træholt, H.W. Zandbergen, TW Li, RJ Drost, PH Kes, AA Menovsky

Transfer system for insertion of specimens into electron microscopes under controlled atmospheres.
Conference paper (1998) - H.W. Zandbergen, P.J. Kooyman, AD van Langeveld

Accurate structure derterminations of very small (4-20 nm) areas, using refinement of dynamic electron diffraction data.
Journal article (1998) - H.W. Zandbergen, J. Jansen

Characterization of single-crystalline Al films grown on Si(111)