13 records found
1
Diffraction line broadening analysis of broadening is caused by both dislocations and limited crystallite size
Defects and morphological changes in nanothin Cu films on Mo(100) studied by thermal helium desorption spectrometry
Diffraction line broadening analysis of broadening is caused by both dislocations and limited crystallize size
Determination of Non-uniform Dislocation Distributions in Polycrystalline Materials
Size-strain analysis using diffraction-line profiles from tilted specimens
Thin Cu films on Mo analyzed by thermal helium desorption spectrometry
Dislocation studies of thin layers under stress
Morphology changes in thin Cu films on Mo
Dislocations in thin metal films observed with X-ray diffraction.
Relation between texture and stress in thin sputtered molybdenum layers.
Relation between macro- and microstress in thin metallic layers.
Early stages of IBAD-film growth: Differences between (100) and polycrystalline Mo substrates.
