Magnetic focusing of an intense slow positron beam for enhanced depth-resolved analysis of thin films and interfaces
Journal Article
(2002)
Author(s)
CV Falub (TU Delft - Old - Section Defects in Materials)
S. W.H. Eijt (TU Delft - Old - Section Defects in Materials)
P.E. Mijnarends (TU Delft - Old - Section Defects in Materials)
Henk Schut (TU Delft - Old - Section Defects in Materials)
A van Veen (TU Delft - Old - Section Defects in Materials)
Research Group
Old - Section Defects in Materials
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https://resolver.tudelft.nl/uuid:10c44fa7-1c2b-4048-821f-418097d17772
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Publication Year
2002
Research Group
Old - Section Defects in Materials
Volume number
488
Pages (from-to)
478-492
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