Lifetime reliability assessment with aging information from low-level sensors
Conference Paper
(2013)
Author(s)
Y. Wang (TU Delft - Computer Engineering)
S. D. Cotofana (TU Delft - Computer Engineering)
L Fang (External organisation)
Research Group
Computer Engineering
DOI related publication
https://doi.org/10.1145/2483028.2483132
To reference this document use:
https://resolver.tudelft.nl/uuid:134dc358-1316-48e6-9663-252905fc48fc
More Info
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Publication Year
2013
Language
English
Research Group
Computer Engineering
Pages (from-to)
339-340
ISBN (print)
978-1-4503-2032-0
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