The negative effect of high-temperature annealing on charge-carrier lifetimes in microcrystalline PCBM
Journal Article
(2006)
Author(s)
JM Warman (TU Delft - ChemE/Opto-electronic Materials)
Thijs de Haas (TU Delft - ChemE/Opto-electronic Materials)
ThD Anthopoulos (External organisation)
DM de Leeuw (External organisation)
Research Group
ChemE/Opto-electronic Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:3fd5f1ba-3056-4628-9a62-e7031287ec61
More Info
expand_more
expand_more
Publication Year
2006
Research Group
ChemE/Opto-electronic Materials
Volume number
18
Pages (from-to)
2294-2298
No files available
Metadata only record. There are no files for this record.