Reliability of (100) and (110) oriented single grain Si TFT's without seed substrate
Conference Paper
(2010)
Author(s)
T Chen (TU Delft - Electronic Components, Technology and Materials)
R. Ishihara (TU Delft - Electronic Components, Technology and Materials)
C.I.M. Beenakker (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/IRPS.2010.5488807
To reference this document use:
https://resolver.tudelft.nl/uuid:448990a0-5694-4d34-b5cb-d916e23d8e44
More Info
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Publication Year
2010
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
342-346
ISBN (print)
978-1-4244-5431-0
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