Impact of spot defects on fault modeling and tests in dual-port memories
Conference Paper
(2001)
Author(s)
S. Hamdioui (TU Delft - Computer Engineering)
AJ van de Goor (External organisation)
D Eastwick (External organisation)
M Rodgers (External organisation)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:96983e9f-f1c9-4360-b325-19822790fcec
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Publication Year
2001
Research Group
Computer Engineering
Pages (from-to)
19-21
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