A model-based approach to fault diagnosis of embedded systems
Conference Paper
(2004)
Author(s)
J Pietersma (TU Delft - Data-Intensive Systems)
A.J.C. van Gemund (TU Delft - Data-Intensive Systems)
A Bos (External organisation)
Research Group
Data-Intensive Systems
To reference this document use:
https://resolver.tudelft.nl/uuid:bbe0d888-5c16-4f6b-80cc-acb3cf3dec31
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Publication Year
2004
Research Group
Data-Intensive Systems
Pages (from-to)
189-196
ISBN (print)
90-803086-9-2
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