Fault (in)dependent cost estimates and conflict-directed backtracking to guide sequential circuit test generation
Conference Paper
(1999)
Author(s)
MH Konijnenburg (External organisation)
JT van Linden (TU Delft - Computer Engineering)
AJ van de Goor Ph D (External organisation)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:dbdf0838-1a0d-4913-9425-e0554e64cfd6
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Publication Year
1999
Research Group
Computer Engineering
Pages (from-to)
185-191
ISBN (print)
0-7695-0315-2
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