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1 Delft testbed interferometer: layout design and research goals
article 2002    
Author: Brug, H. van · Dool, T.C. van den · Gielesen, W.L.M. · Giesen, P. · Oostdijck, B. · D'Arcio, L.
Keywords: Homothetic mapping · Multi aperture interferometry · Wide field imaging
[PDF] [Abstract]

2 A universal color image quality metric
article 2003    
Author: Toet, A. · Lucassen, M.P.
Keywords: Vision · Colour · Image quality · Color image processing · Computational complexity · Image compression · Mathematical models · Signal to noise ratio · Vectors · Color fidelity
[PDF] [Abstract]

3 Baxster : an image quality tester for x-ray baggage screening systems
article 2003    
Author: Bijl, P. · Hogervorst, M.A. · Valeton, J.M. · Ruiter, C.J. de
Keywords: Safety Image processing Informatics · Airport · Aviation safety · Baggage screening · BAXSTER · Electro-Optical system performance · X-ray imaging · Accident prevention · Aviation · Electrooptical devices · Infrared imaging · Laptop computers · Light absorption · X-ray analysis · Image quality · Airfields · Safety · Electro-optics · Triangle orientation discrimination (TOD)
[PDF] [Abstract]

4 A test method for multi-band imaging sensors
article 2003    
Author: Bijl, P. · Hogervorst, M.A.
Keywords: Vision · Multi-band · Sensor performance · Target acquisition · Test method · TOD · Arrays · Imaging systems · Infrared imaging · Surfaces · Minimum resolvable temperature difference (MRTD) · Image sensors · target acquisition · sensor performance · thermal imaging · triangle orientation discrimination (TOD) · minimum resolvable contrast · minimum resolvable temperature difference
[PDF] [Abstract]

5 Guidelines for accurate TOD measurement
article 1999    
Author: Bijl, Piet · Valeton, J.Mathieu
Keywords: Vision · Curve fitting · Electrooptical devices · Equipment testing · Image sensors · Least squares approximations · Performance · Standards · Statistical methods · Electrooptical system performance testing · Objective acceptance rejection criteria · Standard measurement procedure · Triangle orientation discrimination · Imaging systems
[Abstract]

6 Design, development and verification of the HIFI Alignment Camera System
article 2005    
Author: Boslooper, E.C. · Zwan, B.A. van der · Kruizinga, B. · Lansbergen, R.
Keywords: Alignment measurement · Mechanical design · Optical design · Thermal testing · Optical devices · Thermal effects · Cameras
[PDF] [Abstract]

7 Optical characterization of infrared telluride glass fibers for space use
article 2017    
Author: Faber, A.J. · Cheng, L.K. · Gielesen, W.L.M. · Boussard-Plédel, C. · Maurugeon, S. · Bureau, B. · Zhang, X.H. · Lucas, J. · Pereira Do Carmo, J.
Keywords: Materials Physics · Fourier transform infrared spectroscopy · Glass fibers · Semiconducting glass · Tellurium · FTIR spectrophotometers · Optical characterization · Semiconducting materials · Single mode waveguides · Temperature · Industrial Innovation · Fluid Mechanics Chemistry & Energetics · PMC - Process Modelling & Control · TS - Technical Sciences
[PDF]

8 Remote sensing solutions for when spectrometers no longer are affordable
article 2016    
Author: Brug, H. van · Visser, H.
Keywords: Imaging techniques · Spectrometers · Remote sensing system · High Tech Systems & Materials · Industrial Innovation · Nano Technology · OPT - Optics · TS - Technical Sciences
[PDF] [Abstract]

9 Characterizing electron beam induced damage in metrology and inspection of advance devices
article 2017    
Author: Mohtashami, A. · Navarro, V. · Sadeghian Marnani, H. · Englard, I. · Shemesh, D. · Malik, N.S.
Keywords: Electronics · Chemical mechanical polishing · Chemical polishing · Electron beams · Hydrophobicity · Semiconductor device manufacture · Silicon wafers · Units of measurement · 300-mm silicon wafers · E-beam damage · High resolution · Low-k materials · Optical metrology techniques · Scanning probe microscopy techniques · Semiconductor industry · Semiconductor manufacturing · Scanning probe microscopy · Nano Technology · OM - Opto-Mechatronics · TS - Technical Sciences

10 A novel design for a spectropolarimeter; SPEX
article 2013    
Author: Verlaan, A.L. · Brug, H. van · Visser, H.
Keywords: Electronics · Aerosols · Cloud detection · Polarimeter · Spectrometer · High Tech Systems & Materials · Industrial Innovation · Physics & Electronics · OPT - Optics · TS - Technical Sciences
[PDF] [Abstract]

11 Calibration of the SCIAMACHY instrument on the ESA-ENVISAT satellite
article 1999    
Author: Dobber, M.R.
Keywords: Aviation · Atmospheric optics · Calibration · Infrared detectors · Light polarization · Optical properties · Radiometry · Satellite observatories · Radiometric calibration · Scanning imaging absorption spectrometer · Atmospheric chartography · Spectrometers
[PDF] [Abstract]

12 FIT3D Toolbox : multiple view geometry and 3D reconstruction for MATLAB
article 2010    
Author: Esteban, I. · Dijk, J. · Groen, F.
Keywords: Image processing · Image processing · 3D models
[PDF] [Abstract]

13 Laser pointing in the vicinity of jet engine plumes
article 2009    
Author: Schleijpen, H.M.A.
Keywords: Physics · Exhaust plumes · Laser beams · Atmospheric transmission · Atmospheric turbulence · Target tracking · Laser pointing (guidance)
[Abstract]

14 TOD, NVTherm and TRM3 model calculations : a comparison
article 2002    
Author: Bijl, P. · Hogervorst, M.A. · Valeton, J.M.
Keywords: Vision · Electro-optics · Thermal imaging · Triangle orientation discrimination · TOD · Minimum resolvable temperature difference · Electro-optical system performance · MRTD · MTDP · MTF squeeze model · NVTherm · Target acquisition · TRM3 · Automatic target recognition · Cameras · Computer simulation · Electrooptical devices · Optical filters · Optical sensors · Optical transfer function · Scanning · Focal plane array · Minimum resolvable temperature difference · Night vision · Target acquisition · Infrared imaging
[PDF] [Abstract]

15 Applicability of iTIRM for roughness reduction monitoring
article 2001    
Author: Bijl, R.J.M. van der · Brug, H. van · Fähnle, O.W. · Braat, J.J.M.
Keywords: In-situ monitoring · Optical fabrication · Roughness · Grinding (machining) · Helium neon lasers · Laser beams · Light reflection · Light transmission · Monitoring · Polishing · Profilometry · Surface roughness · Intensity-detecting Total internal reflection microscopy · Optical microscopy
[PDF] [Abstract]

16 FO hydrophone with hydrostatic pressure compensation: comparative experiment with a conventional piezo hydrophone
article 1998    
Author: Cheng, L.K. · Bruijn, D. de
[PDF] [Abstract]

17 A new star (sensor) is born
article 2017    
Author: Leijtens, J. · Vliegenthart, W. · Lampridis, D. · Vacanti, G. · Monna, B. · Bechthum, E. · Hagenaars, K. · Heide, E. van der · Kruijff, M. · Breukelen, E. van · Lemair, A.
Keywords: Space applications · Attitude control subsytem · Metal housing · Multiple apertures · Netherlands · Pre-qualification · Predicted performance · Production cost · System size · Attitude control · Observation, Weapon & Protection Systems · DSS - Distributed Sensor Systems · TS - Technical Sciences

18 Performance comparison of different graylevel image fusion schemes through a universal image quality index
article 2003    
Author: Toet, A. · Hogervorst, M.A.
Keywords: Vision · Image fusion · Image quality · Computation theory · Information analysis · Optimization
[PDF] [Abstract]

19 Transferring color to single band intensified nightvision images
article 2004    
Author: Toet, A.
Keywords: Vision · Colour · False colour · Night vision · Intensified imagery · Colour vision · Color transfer · False color · Intensified imagery · Nightvision · Algorithms · Computer graphics · Information analysis · Signal processing · Statistical methods · Color image processing
[PDF] [Abstract]

20 Identifiability : a fast way to measure for identification performance
article 2004    
Author: Hogervorst, M.A. · Bijl, P. · Toet, A. · Miller, B.
Keywords: Vision Informatics · Identification · Modeling · Simulation · Validation · Computer simulation · Data reduction · Mathematical models · Metric system · Parameter estimation · Personnel training · Sensors · Lateral distances · Target conspicuity · Validation · Visual search · Optoelectronic devices
[PDF] [Abstract]

Search results also available in MS Excel format.

Showing 1 to 20 of 310 found. Next | Sort by date