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1 Spectral features : an overview
article 2011    
Author: Brug, H. van
Keywords: Electronics · Aging · Calibration · Optical design · Speckles · Spectral feature · Sun calibration · Temporal averaging · Calibration · Optical design · Instruments · Physics & Electronics · OPT - Optics · TS - Technical Sciences
[PDF] [Abstract]

2 Remote sensing solutions for when spectrometers no longer are affordable
article 2016    
Author: Brug, H. van · Visser, H.
Keywords: Imaging techniques · Spectrometers · Remote sensing system · High Tech Systems & Materials · Industrial Innovation · Nano Technology · OPT - Optics · TS - Technical Sciences
[PDF] [Abstract]

3 New approach to spectral features modeling
article 2012    
Author: Brug, H. van · Scalia, P.S.
Keywords: Electronics · Radiometric accuracy · Remote sensing · Speckles · Spectral features · High Tech Systems & Materials · Industrial Innovation · Physics & Electronics · OPT - Optics · TS - Technical Sciences
[PDF] [Abstract]

4 A novel design for a spectropolarimeter; SPEX
article 2013    
Author: Verlaan, A.L. · Brug, H. van · Visser, H.
Keywords: Electronics · Aerosols · Cloud detection · Polarimeter · Spectrometer · High Tech Systems & Materials · Industrial Innovation · Physics & Electronics · OPT - Optics · TS - Technical Sciences
[PDF] [Abstract]

5 Diffuser properties and according performance in BSDF and spectral features in space application
article 2014    
Author: Gür, B. · Brug, H. van · Xu, M. · Vela Esparza, E.
Keywords: Electronics · BSDF · Radiometric calibration · Diffusers (optical) · Radiometry · Surface properties · Bi-directional · Scattering functions · Spectral feature · Calibration · Space & Scientific Instrumentation · Industrial Innovation · Physics & Electronics · OPT - Optics · TS - Technical Sciences
[PDF] [Abstract]

6 Diffusers, properties and performance in BSDF
article 2014    
Author: Gür, B. · Brug, H. van · Xu, M. · Vela Esparza, E.
Keywords: BSDF · Radiometric calibration · Calibration · Diffraction · Diffusers (optical) · Radiometry · Surface properties · Bi-directional · Experimental activities · Scattering functions · Surface scattering · High Tech Systems & Materials · Industrial Innovation · Physics & Electronics · OPT - Optics · TS - Technical Sciences
[PDF] [Abstract]

7 Fluid jet polishing of optical surfaces
article 1998    
Author: Fähnle, O.W. · Brug, H. van · Frankena, H.J.
Keywords: Electronics
[Abstract]

8 Holographic method for detecting amplitude and phase-shift errors and features in EUV ML reticle blanks
article 2010    
Author: Nijkerk, M.D. · Koster, N.B. · Brug, H. van · Maas, D.J.
Keywords: Electronics · EUV · reticle inspection · Actinic inspection · Contamination control · Defect detection · Development directions · EUV mask blanks · Generating mechanism · Holographic method · Interference lithography · Resist processing · Reticle inspection · Standing wave · Defects · Lithography · Optical instruments · Photomasks · Reflection · Inspection · High Tech Systems & Materials · Industrial Innovation · Physics & Electronics · OPT - Optics NI - Nano Instrumentation · TS - Technical Sciences
[PDF] [Abstract]

9 Spectral features : How to reduce them
article 2009    
Author: Brug, H. van · Bloemendal, D. ten · Goeij, B. de · Vink, R. · Maresi, L.
Keywords: Aviation · Diffuser · Optical design · QVD · Remote sensing · SanDiff · Speckles · Spectral features
[PDF] [Abstract]

10 Delft Testbed Interferometer: a homothetic mapping test setup
article 2004    
Author: Brug, H. van · Oostdijck, B. · Dool, T.C. van den · Giesen, P. · Gielesen, W.L.M.
Keywords: Homothetic mapping · Multi aperture interferometry · Wide field imaging
[PDF] [Abstract]

11 Applicability of iTIRM for roughness reduction monitoring
article 2001    
Author: Bijl, R.J.M. van der · Brug, H. van · Fähnle, O.W. · Braat, J.J.M.
Keywords: In-situ monitoring · Optical fabrication · Roughness · Grinding (machining) · Helium neon lasers · Laser beams · Light reflection · Light transmission · Monitoring · Polishing · Profilometry · Surface roughness · Intensity-detecting Total internal reflection microscopy · Optical microscopy
[PDF] [Abstract]

12 Quantitative roughness measurements with iTIRM
article 2000    
Author: Bijl, R.J.M. van der · Fähnle, O.W. · Brug, H. van · Braat, J.J.M.
Keywords: Electronics · Surface measurements · Roughness · Nondestructive testing
[Abstract]

13 Optical Fabrication in the Optics Research Group
article 2000    
Author: Brug, H. van · Booij, S.M. · Bijl, R.J.M. van der · Fähnle, O.W.
[Abstract]

14 Quantitative surface characterization using a Nomarski microscope
article 2000    
Author: Brug, H. van · Booij, S.M. · Fähnle, O.W. · Bijl, R.J.M. van der
Keywords: Electronics · Interference microscopy · Surface measurements · Roughness · Optical inspection
[Abstract]

15 iTIRM: ruwheidsmetingen aan oppervlakken tijdens bewerking
article 2000    
Author: Bijl, R.J.M. van der · Brug, H. van · Fähnle, O.W.
[Abstract]

16 In-process monitoring of grinding and polishing of optical surfaces
article 2000    
Author: Bijl, R.J.M. van der · Fähnle, O.W. · Brug, H. van · Braat, J.J.M.
[Abstract]

17 Experimental set-up for testing alignment and measurement stability of a metrology system in Silicon Carbide for GAIA
article 2005    
Author: Veggel, M. van · Wielders, A.A. · Brug, H. van · Rosielle, N. · Nijmeijer, H.
Keywords: GAIA · Measurement · Metrology · Silicon carbide · Stability · Interferometers · Optical telescopes · Thermodynamic properties · Vibrations (mechanical) · Optical path · Vacuum tank
[PDF] [Abstract]

18 In-process measurements of material removal in fluid jet polishing
article 2002    
Author: Brug, H. van · Groeneveld, M. · Booij, S.M. · Braat, J.J.M.
Keywords: In-process · Interferometry · Optical fabrication · Polishing · Temporal phase unwrapping · FJP · Mathematical models · Surface roughness · Fluid jet polishing (FJP)
[PDF] [Abstract]

19 iTIRM: a nondestructive measuring technique to monitor surface quality during grinding and polishing
article 2000    
Author: Bijl, R.J.M. van der · Fähnle, O.W. · Brug, H. van · Braat, J.J.M.
Keywords: Optical fabrication · Subsurface damage · iTIRM · Process monitoring
[Abstract]

20 Subsurface damage measurements as a tool for process monitoring
article 1999    
Author: Bijl, R.J.M. van der · Fähnle, O.W. · Brug, H. van
Keywords: Electronics · Optical fabrication · Subsurface damage · TIRM · Process monitoring
[Abstract]

Search results also available in MS Excel format.

Showing 1 to 20 of 29 found. Next | Sort by date