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1 Uncertainty considerations for interferometric stability testing
article 2008    
Author: Ellis, J.D. · Joo, K.N. · Verlaan, A.L. · Spronck, J.W.
Keywords: Electronics · Industrial Innovation
[Abstract]

2 Optically balanced, multi-pass displacement interferometry for picometer stability testing
article 2007    
Author: Ellis, J.D. · Hatzigeorgopoulos, J.H. · Spronck, J.W. · Schmidt, R.H.M.
Keywords: Instruments · Sustainable Chemical Industry · Industrial Innovation

3 Interferometric system for PM-level stability characterization
article 2010    
Author: Verlaan, A.L. · Ellis, J.D. · Voigt, D. · Spronck, J.W. · Munnig Schmidt, R.H.
Keywords: Electronics · High Tech Systems & Materials · Industrial Innovation · Physics & Electronics · OPT - Optics · TS - Technical Sciences
[Abstract]

4 Frequency stabilized HeNe gas laser with 3.5 mW from a single mode
article 2012    
Author: Ellis, J.D. · Voigt, D. · Spronck, J.W. · Verlaan, A.L. · Munnig Schmidt, R.H.
Keywords: Physics · Frequency metrology · HeNe lasers · Interferometry · Laser stabilization · Optical metrology · Industrial Innovation · Physics & Electronics · OPT - Optics · TS - Technical Sciences
[Abstract]

5 Interferometry for picometer-level dimensional stability measurements
article 2011    
Author: Voigt, D. · Ellis, J.D. · Verlaan, A.L. · Bergmans, R.H. · Spronck, J.W. · Munnig Schmidt, R.H.
Keywords: Air refractive index · Balanced configurations · Beam path · Close proximity · Common mode rejections · Constructional elements · Contact less · Cost factors · Cycle stability · In-situ · Industrial equipment · Instability events · Measurement uncertainty · Optical heterodyne interferometer · Optical scheme · Recalibrations · Reference beams · Sampling rates · Semiconductor industry · Space missions · Stability measurements · Thermal drifts · Time-scales · Typical samples · Vacuum tube · Zerodur · Bolted joints · Electron optics · Interferometers · Interferometry · Optics · Quantum electronics · Refractive index · Refractometers · Semiconductor device manufacture · Semiconductor lasers · Silicon carbide · Thermal expansion · Uncertainty analysis · Dimensional stability · Physics & Electronics · OPT - Optics · TS - Technical Sciences
[Abstract]

Search results also available in MS Excel format.

Showing 1 to 5 of 5 found. | Sort by date