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1 Polymer substrates for flexible electronics: achievements and challenges
article 2010    
Author: Yakimets, I. · MacKerron, D. · Giesen, P. · Kilmartin, K.J. · Goorhuis, M. · Meinders, E.R. · MacDonald, W.A.
Keywords: Electronics · Coefficient of thermal expansion · Dimensional stability · Refractive index · High Tech Systems & Materials · Industrial Innovation · Mechatronics, Mechanics & Materials · HOL - Holst · TS - Technical Sciences
[Abstract]

2 A common gate thin film transistor on poly(ethylene naphthalate) foil using step-and-flash imprint lithography
article 2011    
Author: Moonen, P.F. · Vratzov, B. · Smaal, W.T.T. · Gelinck, G.H. · Peter, M. · Meinders, E.R. · Huskens, J.
Keywords: Electronics · Flexible thin film transistor · Foil-on-carrier · Step-and-flash imprint lithography · Bottom contacts · Bottom gate · Bottom-contact · Common gates · Flexible thin films · Foil-on-carrier · High quality · On/off ratio · Patterning techniques · Poly(ethylene naphthalate) · Residual layer thickness · Roll to roll · Source-drain · State-of-the-art devices · Step and flash imprint lithography · TIPS-pentacene · Dimensional stability · Ethylene · Fabrication · Nanoimprint lithography · Thin films · Transistors · Thin film transistors · High Tech Systems & Materials · Industrial Innovation · Mechatronics, Mechanics & Materials · HOL - Holst · TS - Technical Sciences
[Abstract]

3 Interferometry for picometer-level dimensional stability measurements
article 2011    
Author: Voigt, D. · Ellis, J.D. · Verlaan, A.L. · Bergmans, R.H. · Spronck, J.W. · Munnig Schmidt, R.H.
Keywords: Air refractive index · Balanced configurations · Beam path · Close proximity · Common mode rejections · Constructional elements · Contact less · Cost factors · Cycle stability · In-situ · Industrial equipment · Instability events · Measurement uncertainty · Optical heterodyne interferometer · Optical scheme · Recalibrations · Reference beams · Sampling rates · Semiconductor industry · Space missions · Stability measurements · Thermal drifts · Time-scales · Typical samples · Vacuum tube · Zerodur · Bolted joints · Electron optics · Interferometers · Interferometry · Optics · Quantum electronics · Refractive index · Refractometers · Semiconductor device manufacture · Semiconductor lasers · Silicon carbide · Thermal expansion · Uncertainty analysis · Dimensional stability · Physics & Electronics · OPT - Optics · TS - Technical Sciences
[Abstract]

4 Advances in maskless and mask-based optical lithography on plastic flexible substrates
article 2009    
Author: Barbu, I. · Ivan, M.G. · Giesen, P. · Moosdijk, M. van de · Meinders, E.R.
Keywords: Electronics · Flexible substrate · Optical maskless lithography · Pixel grid imaging · Plastic electronics · Spatial light modulator · Added values · Cost of ownership · Emerging technologies · Flexible plastic substrates · Flexible substrate · Fundamental building blocks · Gold-coated · In-plane · In-situ · Mask less · Mask-less lithography · Moisture uptake · New series · Nonlinear deformations · Optical lithography · Optical maskless lithography · Patterned layers · Plastic electronics · Plastic flexible · Plastic foils · Potential applications · Potential growth · Processing steps · Single layer · Spatial light modulators · Cost reduction · Dimensional stability · Economic analysis · Flexible displays · Gold coatings · Light modulation · Organic light emitting diodes (OLED) · Photolithography · Pixels · Plastics · Pulse circuits · Semiconducting silicon compounds · Silicon wafers · Substrates · Light modulators · Industrial Innovation
[PDF] [Abstract]

Search results also available in MS Excel format.

Showing 1 to 4 of 4 found. | Sort by date