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1 Electron trapping in higher adduct fullerene-based solar cells
article 2009    
Author: Lenes, M. · Shelton, S.W. · Sieval, A.B. · Kronholm, D.F. · Hummelen, J.C. · Blom, P.W.M.
Keywords: Electronics · Bis-adducts · Bulk heterojunction · Device performance · Electron transport · Electron trapping · Lowest unoccupied molecular orbital · Shallow traps · Solar cell performance · Cell membranes · Electron mobility · Electrons · Heterojunctions · Isomers · Molecular orbitals · Open circuit voltage · Photovoltaic cells · Solar cells · Fullerenes · Industrial Innovation
[Abstract]

2 Real-time NO2 detection at ppb level with ZnO field-effect transistors
article 2013    
Author: Andringa, A.-M. · Smits, E.C.P. · Klootwijk, J.H. · Leeuw, D.M. de
Keywords: Electronics · Dynamic read out · Electron trapping · Field-effect transistor · NO2 sensors · Real-time sensor · Stretched-exponential · Threshold voltage shift · High Tech Systems & Materials · Industrial Innovation · Mechatronics, Mechanics & Materials · HOL - Holst · TS - Technical Sciences
[Abstract]

3 Optical detection of deep electron traps in poly(p-phenylene vinylene) light-emitting diodes
article 2011    
Author: Kuik, M. · Vandenbergh, J. · Goris, L. · Begemann, E.J. · Lutsen, L. · Vanderzande, D.J.M. · Manca, J.V. · Blom, P.W.M.
Keywords: Electronics · Conformational defects · Deep electron traps · Electron currents · Electron trapping · Gaussians · Lowest unoccupied molecular orbital · Optical detection · Photothermal deflection spectroscopy · Poly(p-phenylene vinylene) derivatives · Poly(p-phenylenevinylene) · Polymer chains · PPV derivatives · Spectroscopy measurements · Trap distributions · Defects · Electron traps · Emission spectroscopy · Light emitting diodes · Molecular orbitals · Aromatic compounds · Industrial Innovation · Mechatronics, Mechanics & Materials · HOL - Holst · TS - Technical Sciences
[Abstract]

4 Physical and chemical degradation behavior of sputtered aluminum doped zinc oxide layers for Cu(In,Ga)Se2 solar cells
article 2014    
Author: Theelen, M. · Boumans, T. · Stegeman, F. · Colberts, F. · Illiberi, A. · Berkum, J. van · Barreau, N. · Vroon, Z. · Zeman, M.
Keywords: Materials Energy · Aluminum-doped zinc oxide · Copper indium gallium selenide · Damp heat · Degradation · Grain boundaries · Sputtering · Zinc hydroxide · Damp heat · Electron trapping sites · Gallium selenides · Space charge regions · Zinc hydroxide · Borosilicate glass · Chlorine compounds · Crystal structure · Degradation · Freons · Gallium · Grain boundaries · Nuclear physics · Optical data processing · Optical films · Optical variables measurement · Sputtering · X ray diffraction · Zinc sulfide · Industrial Innovation · Mechanics, Materials and Structures · TFT - Thin Film Technology · TS - Technical Sciences
[Abstract]

5 Gate-bias controlled charge trapping as a mechanism for NO2 detection with field-effect transistors
article 2011    
Author: Andringa, A.-M. · Meijboom, J.R. · Smits, E.C.P. · Mathijssen, S.G.J. · Blom, P.W.M. · Leeuw, D.M. de
Keywords: Electronics · air quality sensors · charge trapping · field-effect transistors · NO2 sensors · ZnO · Ambipolar semiconductor · Chemiresistors · Commercial sensors · Detection mechanism · Electron trapping · Exponential time · Gate bias · Human health · Nitrogen dioxides · NO sensors · P-type · Positive gate bias · Sensing mechanism · Threshold voltage shifts · ZnO · Air quality · Bias voltage · Charge trapping · Nitrogen oxides · Sensors · Threshold voltage · Zinc oxide · Field effect transistors · Industrial Innovation · Mechatronics, Mechanics & Materials · HOL - Holst · TS - Technical Sciences
[Abstract]

Search results also available in MS Excel format.

Showing 1 to 5 of 5 found. | Sort by date