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1 Three-port interferometer in silicon-on-insulator for wavelength monitoring and displacement measurement
article 2011    
Author: Harmsma, P. · Staats, J.P. · Lo Cascio, D.M.R. · Cheng, L.K.
Keywords: Displacement measurements · Fiber Bragg grating (fbg) · Fixed wavelength · Interrogation system · Narrow bands · Optical signals · Path length difference · Silicon on insulator · Wavelength monitoring · Electron optics · Fiber Bragg gratings · Optics · Quantum electronics · Interferometers · Physics & Electronics · OPT - Optics · TS - Technical Sciences
[Abstract]

2 Detection of nanobubble generation and stability by a SOI nanophotonic ring resonator
article 2011    
Author: Yang, S. · Harmsma, P. · Pozo Torres, J.M. · Yousefi, M.
Keywords: Colloidal system · Experimental data · Hydrophobic surfaces · Laplace pressure · Liquid-solid interfaces · Nano-bubble · Nano-meter-scale · Nanobubbles · Physical aspects · Radius of curvature · Ring resonator · Technical applications · Thermodynamic laws · Time-scales · Electron optics · Hydrophobicity · Liquid lasers · Liquids · Nanophotonics · Quantum electronics · Surface chemistry · Phase interfaces · Physics & Electronics · NI - Nano Instrumentation · TS - Technical Sciences
[Abstract]

3 Characterization of the influence of strain on the optical properties of waveguides and microresonators in silicon-on-insulator technology
article 2011    
Author: Westerveld, W.J. · Harmsma, P.J. · Schmits, R. · Tabak, E. · Pozo Torres, J.M. · Urbach, H.P. · Yousefi, M.
Keywords: Physics · Applied strain · CMOS technology · Effect of strain · Effective index · High refractive index contrasts · Lateral confinement · Mass fabrication · Micro resonators · Microring resonator · Modal dispersion · Optical sensing · Photonic circuits · Photonic integrated circuits · Ring resonator · Silicon on insulator · Silicon-on-insulators · SOI waveguides · Strain gauge · CMOS integrated circuits · Electron optics · Gages · Optical resonators · Optics · Photonic integration technology · Quantum electronics · Refractive index · Waveguides · Silicon on insulator technology · Physics & Electronics · NI - Nano Instrumentation · TS - Technical Sciences
[Abstract]

4 Interferometry for picometer-level dimensional stability measurements
article 2011    
Author: Voigt, D. · Ellis, J.D. · Verlaan, A.L. · Bergmans, R.H. · Spronck, J.W. · Munnig Schmidt, R.H.
Keywords: Air refractive index · Balanced configurations · Beam path · Close proximity · Common mode rejections · Constructional elements · Contact less · Cost factors · Cycle stability · In-situ · Industrial equipment · Instability events · Measurement uncertainty · Optical heterodyne interferometer · Optical scheme · Recalibrations · Reference beams · Sampling rates · Semiconductor industry · Space missions · Stability measurements · Thermal drifts · Time-scales · Typical samples · Vacuum tube · Zerodur · Bolted joints · Electron optics · Interferometers · Interferometry · Optics · Quantum electronics · Refractive index · Refractometers · Semiconductor device manufacture · Semiconductor lasers · Silicon carbide · Thermal expansion · Uncertainty analysis · Dimensional stability · Physics & Electronics · OPT - Optics · TS - Technical Sciences
[Abstract]

Search results also available in MS Excel format.

Showing 1 to 4 of 4 found. | Sort by date