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Showing 1 to 20 of 27 found. Next | Sort by date

1 First results from the Large Dynamic Range Atomic Force Microscope for overlay metrology
article 2019    
Author: Witvoet, G. · Peters, J. · Kuiper, S. · Keyvani, S. · Willekers, R.W.
Keywords: AFM · LDR-AFM · Control · Identification · Metrology · Overlay · Positioning · Atomic force microscopy · Microscopy · High Tech Systems & Materials · Industrial Innovation
[Abstract]

2 A comprehensive model for transient behavior of tapping mode atomic force microscope
article 2019    
Author: Keyvani, A. · Tamer, M.S. · Wingerden, J.W. van · Goosen, J.F.L. · Keulen, F. van
Keywords: Tapping mode AFM · Transient analysis · Modulated model · Chaos · Speed limit of AFM · Atomic force microscope · Microscopy · High Tech Systems & Materials · Industrial Innovation
[Abstract]

3 Analysis of contact stiffness in ultrasound atomic force microscopy: three-dimensional time-dependent ultrasound modeling
article 2017    
Author: Piras, D. · Sadeghian Marnani, H.
Keywords: Physics · Contact stiffness · Ultrasound AFM · Nanoimaging · Hertz contact · Subsurface AFM · Subsurface nanoimaging · High Tech Systems & Materials · Industrial Innovation · Nano Technology · OM - Opto-Mechatronics · TS - Technical Sciences
[PDF] [Abstract]

4 On the origin, growth and applications of ripples
article 2008    
Author: Huis in 't Veld, A.J. · Groenendijk, M.N.W. · Fischer, H.R.
Keywords: Physics · Femto · Laserpulses · Ripples · Initiation · Nanostructure · Twins · Steel · SEM · AFM · Hydrophobicity · Industrial Innovation
[Abstract]

5 Automated cantilever exchange and optical alignment for high-throughput parallel Atomic Force Microscopy
article 2017    
Author: Sadeghian Marnani, H. · Bijnagte, A.A. · Herfst, R.W. · Kramer, G.F.IJ. · Kramer, L. · Dekker, A.
Keywords: Atomic Force Microscopy · AFM · Automated cantilever exchange · Optical alignment · Parallel AFM · NOMI Nano Opto-Mechatronics Instruments Group · High Tech Systems & Materials · Industrial Innovation · 2015 Nano Technology · OM - Opto-Mechatronics · TS - Technical Sciences
[Abstract]

6 Adhesion experiments using an AFM-Parameters of influence
article 2010    
Author: Dos Santos Ferreira, O. · Gelinck, E.R.M. · Graaf, D. de · Fischer, H.
Keywords: Electronics · Abrasion tip · Adhesion · AFM · Contact area · Contact time · FIB · Tip modification · Adhesion forces · Adhesion measurement · AFM · Contact areas · Contact forces · Contact time · Experimental protocols · Quantitative result · Abrasion · Atomic force microscopy · Materials testing · Tribology · Adhesion
[Abstract]

7 Improved sub-surface AFM using photothermal excitation
article 2019    
Author: Reijzen, M.E. van · Tamer, M.S. · Es, M.H. van · Riel, M.C.J.M. van · Keyvani Janbahan, A. · Sadeghian Marnani, S. · Lans, M.J. van der
Keywords: AFM · Subsurface imaging · Frequency modulation · Photothermal excitation · Critical dimensions and overlay metrology · High Tech Systems & Materials · Industrial Innovation
[PDF] [Abstract]

8 Improved sub-surface AFM using photothermal excitation
lecture 2019    
Author: Keyvani Janbahan, A. · Reijzen, M.E. van · Tamer, M.S. · Es, M.H. van · Riel, M.C.J.M. van · Sadeghian Marnani, S. · Lans, M.J. van der
Keywords: AFM · Subsurface imaging · Frequency modulation · Photothermal excitation · Critical dimensions and overlay metrology · High Tech Systems & Materials · Industrial Innovation
[PDF]

9 Towards Quantitative Stiffness based Subsurface AFM
report 2019    
Author: Piras, D. · Fillinger, L. · Rajadurai, S.R.S. · Es, M.H. van · Lans, M.J. van der
Keywords: Quantitative stiffness based Subsurface AFM · ERP Early Research Program · 3D Nanomanufacturing Instruments · High Tech Systems & Materials · Industrial Innovation
[Abstract]

10 A new approach to study local corrosion processes on steel surfaces by combining different microscopic techniques
article 2012    
Author: Heyer, A. · D'Souza, F. · Bruin, A. · Ferrari, G. · Mol, J.M.C. · Wit, J.H.W. de
Keywords: Materials · AFM · Bacteria · EFM · SEM · Industrial Innovation · Mechatronics, Mechanics & Materials · MPC - Materials Performance Centre · TS - Technical Sciences
[Abstract]

11 Results from the Large Dynamic Range Atomic Force Microscope
report 2019    
Author: Peters, J. · Herfst, R. · Witvoet, G. · Kuiper, S. · Es, M.H. van · Willekers, R.W.
Keywords: Telescopes · Large Dynamic Range Atomic Force Microscope · LDR-AFM · ERP Early Research Program · ERP 3D Nanomanufacturing Instruments · High Tech Systems & Materials · Industrial Innovation
[PDF] [Abstract]

12 Piezoelectricity enhancement of P(VDF/TrFE) by X-ray irradiation
article 2016    
Author: Pilet, N. · Khikhlovskyi, V. · Breemen, A.J.J.M. van · Michels, J.J. · Kemerink, M. · Gelinck, G. · Warnicke, P. · Bernard, L.
Keywords: Electronics · AFM · Morphology · Organic memory · P(VDF-TrFE) · Piezo force microscopy · Piezoelectric polymer · STXM · Industrial Innovation · Nano Technology · HOL - Holst · TS - Technical Sciences
[Abstract]

13 On the interfacial interaction between bituminous binders and mineral surfaces as present in asphalt mixtures
article 2013    
Author: Fischer, H.R. · Dillingh, E.C. · Hermse, C.G.M.
Keywords: Materials · AFM · Asphalt adhesion · Bitumen microstructure · Contact angle · Wetting · High Tech Systems & Materials · Industrial Innovation · Mechatronics, Mechanics & Materials · MIP - Materials for Integrated Products · TS - Technical Sciences
[Abstract]

14 Quantitative temperature-depending mapping of mechanical properties of bitumen at the nanoscale using the AFM operated with PeakForce TappingTM mode
article 2013    
Author: Fischer, H.R. · Stadler, H. · Erina, N.
Keywords: Materials · AFM · Bitumen · Nanomechanics · PeakForce Tapping · Quantitative mapping · High Tech Systems & Materials · Industrial Innovation · Mechatronics, Mechanics & Materials · MIP - Materials for Integrated Products · TS - Technical Sciences
[Abstract]

15 On the investigation of the bulk microstructure of bitumen - Introducing two new techniques
article 2014    
Author: Fischer, H.R. · Dillingh, E.C.
Keywords: Structures Traffic Materials · AFM · Bitumen microstructure · Scanning Acoustics Microscope · Industrial Innovation · Mechanics, Materials and Structures · MIP - Materials for Integrated Products · TS - Technical Sciences
[Abstract]

16 Biodegradation of ballast tank coating investigated by impedance spectroscopy and microscopy
article 2014    
Author: Heyer, A. · D'Souza, F. · Zhang, X. · Ferrari, G.M. · Mol, J.M.C. · Wit, J.H.W. de
Keywords: Materials · AFM · Bacteria · Electrochemical impedance spectroscopy · Epoxy coating · Industrial Innovation · Mechanics, Materials and Structures · MIP - Materials for Integrated Products · TS - Technical Sciences
[Abstract]

17 On the microstructure of bituminous binders
article 2014    
Author: Fischer, H.R. · Dillingh, E.C. · Hermse, C.G.M.
Keywords: Materials · AFM · bitumen · microstructure · phase changes · temperature dependent · Mobility Industrial Innovation · Mechanics, Materials and Structures · MIP - Materials for Integrated Products · TS - Technical Sciences
[Abstract]

18 Laboratory investigation of bitumen based on round robin DSC and AFM tests
article 2014    
Author: Soenen, H. · Besamusca, J. · Fischer, H.R. · Poulikakos, L.D. · Planche, J.P. · Das, P.K. · Kringos, N. · Grenfell, J.R.A. · Lu, X. · Chailleux, E.
Keywords: Materials · AFM · Asphalt · Bitumen · DSC · Multiphase material · Wax · Industrial Innovation · Mechanics, Materials and Structures · MIP - Materials for Integrated Products · TS - Technical Sciences
[Abstract]

19 Deep subsurface imaging with subsurface probe micro-scopy @ GHZ
report 2019    
Author: Neer, P.L.M.J. van · Es, M.H. van · Piras, D. · Navarro, V. · Mohtashami, A. · Lans, M.J. van der · Sadeghian Marnani, H.
Keywords: Deep surface imaging · Microscopy · GHz SPM · Atomic Force Microsopy (AFM) · Subsurface Probe Microscopy (SSPM) · ERP Early Research Program · ERP 3D Nanomanufacturing Instruments · High Tech Systems & Materials · Industrial Innovation
[Abstract]

20 On the origin of amplitude reduction mechanism in tapping mode atomic force microscopy
article 2018    
Author: Keyvani Janbahan, A. · Sadeghian Marnani, H. · Goosen, H. · Keulen, F. van
Keywords: Physical properties · Physics · Non-linear model · Numerical solution · Operation parameters · Reduction mechanisms · Resonance frequencies · TM-AFM · Tapping-mode atomic force microscopy · Tip-sample interaction · Atomic force microscopy · High Tech Systems & Materials · Industrial Innovation
[Abstract]

Search results also available in MS Excel format.

Showing 1 to 20 of 27 found. Next | Sort by date