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Showing 1 to 6 of 6 found. | Sort by date

1 Mechanisms of bioleaching and the visualization of these by combined AFM & EFM
article 2009    
Author: Sand, W. · Florian, B. · Noël, N.
Keywords: Bioleaching · Atomic force microscope · Epifluorescence microscope · Interfaces
[Abstract]

2 A centrifuge method to measure particle cohesion forces to substrate surfaces: The use of a force distribution concept for data interpretation
article 2010    
Author: Nguyen, T.T. · Rambanapasi, C. · Boer, A.H.de · Frijlink, H.W. · Ven, P.M.V.D. · Vries, J.de · Busscher, H.J. · Maarschalk, K.V.V.
Keywords: Biology · Food technology · Adhesion force · Atomic force microscope · Centrifuge method · Cohesion force · Dry powder mixtures · Force distribution concept
[Abstract]

3 A comprehensive model for transient behavior of tapping mode atomic force microscope
article 2019    
Author: Keyvani, A. · Tamer, M.S. · Wingerden, J.W. van · Goosen, J.F.L. · Keulen, F. van
Keywords: Tapping mode AFM · Transient analysis · Modulated model · Chaos · Speed limit of AFM · Atomic force microscope · Microscopy · High Tech Systems & Materials · Industrial Innovation
[Abstract]

4 Results from the Large Dynamic Range Atomic Force Microscope
report 2019    
Author: Peters, J. · Herfst, R. · Witvoet, G. · Kuiper, S. · Es, M.H. van · Willekers, R.W.
Keywords: Telescopes · Large Dynamic Range Atomic Force Microscope · LDR-AFM · ERP Early Research Program · ERP 3D Nanomanufacturing Instruments · High Tech Systems & Materials · Industrial Innovation
[PDF] [Abstract]

5 High-speed AFM for 1x node metrology and inspection: does it damage the features?
article 2015    
Author: Sadeghian Marnani, H. · Dool, T.C. van den · Uziel, Y. · Bar Or, R.
Keywords: Electronics · AFM · Atomic force microscope · Cantilever · Tip sample interaction · Wafer · Resist · Damage · Metrology · Inspection · High Tech Systems & Materials · Industrial Innovation · Mechatronics, Mechanics & Materials · OM - Opto-Mechatronics · TS - Technical Sciences
[PDF] [Abstract]

6 Demonstration of Parallel Scanning Probe Microscope for high throughput metrology and inspection
article 2015    
Author: Sadeghian Marnani, H. · Dekker, A. · Herfst, R.W. · Winters, J. · Eigenraam, A.B.C. · Rijnbeek, R.A. · Nulkes, N.
Keywords: Electronics · Parallel atomic force microscope · Scanning probe microscope · Wafer · Mask · CD-metrology · Defect review · Process control · High Tech Systems & Materials · Industrial Innovation · Mechatronics, Mechanics & Materials · OM - Opto-Mechatronics · TS - Technical Sciences
[PDF] [Abstract]

Search results also available in MS Excel format.

Showing 1 to 6 of 6 found. | Sort by date