Repository hosted by TU Delft Library

Home · Contact · About · Disclaimer ·
 

Search results also available in MS Excel format.

Showing 1 to 20 of 32 found. Next | Sort by date

1 On the origin of amplitude reduction mechanism in tapping mode atomic force microscopy
article 2018    
Author: Keyvani Janbahan, A. · Sadeghian Marnani, H. · Goosen, H. · Keulen, F. van
Keywords: Physical properties · Physics · Non-linear model · Numerical solution · Operation parameters · Reduction mechanisms · Resonance frequencies · TM-AFM · Tapping-mode atomic force microscopy · Tip-sample interaction · Atomic force microscopy · High Tech Systems & Materials · Industrial Innovation
[Abstract]

2 First results from the Large Dynamic Range Atomic Force Microscope for overlay metrology
article 2019    
Author: Witvoet, G. · Peters, J. · Kuiper, S. · Keyvani, S. · Willekers, R.W.
Keywords: AFM · LDR-AFM · Control · Identification · Metrology · Overlay · Positioning · Atomic force microscopy · Microscopy · High Tech Systems & Materials · Industrial Innovation
[Abstract]

3 Microscopic understanding of the anisotropic conductivity of PEDOT:PSS thin films
article 2007    
Author: Nardes, A.M. · Kemerink, M. · Janssen, R.A.J. · Bastiaansen, J.J.A.M. · Kiggen, N.M.M. · Langeveld, B.M.W. · Breemen, A.J.J.M. van · Kok, M.M. de
Keywords: Atomic force microscopy · Electric conductivity · Magnetic anisotropy · Scanning tunneling microscopy · Spin coating · Anisotropic conductivity · Polystyrenesulfonate · Thin films
[Abstract]

4 Chaos: the speed limiting phenomenon in dynamic atomic force microscopy
article 2017    
Author: Keyvani Janbahan, A. · Alijani, F. · Sadeghian Marnani, H. · Maturova, K. · Goosen, H. · Keulen, F. van
Keywords: Atomic force microscopy · Lyapunov methods · Bifurcation diagram · Cartesian coordinate · Closed-loop bandwidth · Dynamic atomic force microscopy · New mathematical model · Operation parameters · Tapping-mode atomic force microscopy · Closed-loop systems · NOMI Nano Opto-Mechatronics Instruments Group · High Tech Systems & Materials · Industrial Innovation
[PDF] [Abstract]

5 Investigation of the chromate conversion coating on Alclad 2024 aluminium alloy: effect of the pH of the chromate bath
article 2002    
Author: Campestrini, P. · Westing, E.P.M. van · Hovestad, A. · Wit, J.H.W. de
Keywords: Chemistry · Impedance · Atomic force microscopy · Chromate coatings · Corrosion protection · Corrosion resistance · Ellipsometry · pH effects · Scanning electron microscopy · Spectroscopic analysis · Substrates · Conversion coatings · Aluminum alloys
[Abstract]

6 Photovoltaic properties of a conjugated polymer blend of MDMO-PPV and PCNEPV
article 2004    
Author: Veenstra, S.C. · Verhees, W.J.H. · Kroon, J.M. · Koetse, M.M. · Sweelssen, J. · Bastiaansen, J.J.A.M. · Schoo, H.F.M. · Yang, X. · Alexeev, A. · Loos, J. · Schubert, U.S. · Wienk, M.M.
Keywords: Electronics · Aromatic compounds · Binary mixtures · Charge transfer · Heat treatment · Conjugate polymers · Power conversions · Polymer blends · Absorption spectroscopy · Atomic force microscopy · Polymerization · Semiconductors · Transmission electron microscopy · MDMO-PPV · PCNEPV
[Abstract]

7 Image-based overlay measurement using subsurface ultrasonic resonance force microscopy
other 2018    
Author: Tamer, M.S. · Lans, M.J. van der · Sadeghian Marnani, H.
Keywords: Electronics · Atomic Force Microscopy · Image-Based Overlay Measurement · Inspection · Metrology · Subsurface microscopy · Subsurface Ultrasonic Force Microscopy · High Tech Systems & Materials · Industrial Innovation
[Abstract]

8 Sounding out buried nanostructures using subsurface ultrasonic resonance force microscopy
article 2018    
Author: Es, M.H. van · Mohtashami, A. · Neer, P.L.M.J. van · Sadeghian Marnani, H.
Keywords: Nanostructures · Scanning probe microscopy · Ultrasonic applications · Viscoelasticity · Contact resonance · Fundamental research · Nanoscale structure · Semiconductor manufacturing · Semiconductor manufacturing process · Ultrasonic force microscopy · Ultrasonic resonances · Viscoelastic properties · Atomic force microscopy
[Abstract]

9 3D Advance Metrology by means of 3D Atomic Force Microscopy
report 2019    
Author: Herfst, R.W. · Nulkes-de Groot, N. · Lucas, P. · Bijnagte, T. · Dekker, B. · Biemond, J.J.B. · Riel, M.J.C.M. van · Essen, B.H.M.F. van · Koppen, M.E.C.T. van · Oosterling, J.A.J. · Kramer, L. · Nieuwkoop, E. · Corbet, F. · Visser, L. · Man, H.
Keywords: Metrology · Microscopy · 3D atomic force microscopy · ERP Early Research Program · ERP 3D Nanomanufacturing Instruments · High Tech Systems & Materials · Industrial Innovation
[Abstract]

10 Advanced excitation waveforms in ultrasound sub-surface atomic force microscopy
report 2019    
Author: Rajadurai, S.R.S. · Piras, D. · Hatakeyama, K. · Neer, P.L.M.J. · Es, M.H. van · Lans, M.J. van der
Keywords: Waveforms · Advanced excitation waveforms · Microscopy · Ultrasound sub-surface atomic force microscopy · ERP Early Research Program · ERP 3D Nanomanufacturing Instruments · High Tech Systems & Materials · Industrial Innovation
[Abstract]

11 Frequency Modulation Sub-surface Atomic Force Microscopy
report 2019    
Author: Keyvani Janbahan, A. · Tamer, M.S. · Es, M.H. van · Lans, M.J. van der
Keywords: Frequency · Frequency modulation · Microscopy · Sub-surface atomic force microscopy · ERP Early Research Program · ERP 3D Nanomanufacturing Instruments · High Tech Systems & Materials · Industrial Innovation
[PDF] [Abstract]

12 The optimal structure-conductivity relation in epoxy-phthalocyanine nanocomposites
article 2006    
Author: Huijbregts, L.J. · Brom, H.B. · Brokken-Zijp, J.C.M. · Kemerink, M. · Chen, Z. · Goeje, M.P. de · Yuan, M. · Michels, M.A.J.
Keywords: Atomic force microscopy · Coating techniques · Dielectric devices · Electric conductivity · Optimization · Percolation (solid state) · Epoxy coatings · Epoxy phthalocyanine nanocomposites · Percolation threshold · Semiconducting nanocrystals · Nanostructured materials
[Abstract]

13 Response of the microstructure of bitumen upon stress–damage initiation and recovery
article 2014    
Author: Fischer, H.R. · Dillingh, E.C.
Keywords: Aged binder · Asphalt · Atomic force microscopy · Bitumen · Cracks · Failure · In situ tensile test · Recovery · Industrial Innovation · Mechanics, Materials and Structures · MIP - Materials for Integrated Products · TS - Technical Sciences
[Abstract]

14 The effect of protein-protein and protein-membrane interactions on membrane fouling in ultrafiltration
article 2000    
Author: Huisman, I.H. · Prádanos, P. · Hernández, A.
Keywords: Nutrition · Fouling · Physicochemical interactions · Protein · Protein-membrane interactions · Ultrafiltration · Atomic force microscopy · Mechanical permeability · PH effects · Proteins · Ultrafiltration · Bovine serum albumin · Polymeric membranes · Bovine serum albumin · Electrolyte · Polymer · Polysulfone · Protein · Membrane · Membrane technology · Ultrafiltration · Artificial membrane · Atomic force microscopy · Membrane permeability · Membrane transport · Performance · PH · Priority journal · Protein analysis · Protein protein interaction · Protein transport · Ultrafiltration
[Abstract]

15 Efficient and Stable Acoustical Coupling for GHz Subsurface Probe Microscopy
article 2018    
Author: Quesson, B.A.J. · Neer, P.L.M.J. van · Riel, M.C.J.M. van · Es, M.H. van · Piras, D. · Hatakeyama, K. · Mohtashami, A. · Navarro, V. · Duivenvoorde, T. · Sadeghian Marnani, H.
Keywords: Acoustical coupling · Atomic force microscopy · GHz excitation · Scanning probe microscopy · Stability analysis · Subsurface · Acoustic measuring instruments · Acoustic variables measurement · Atomic force microscopy · Elastic waves · Scanning probe microscopy · Transducers · Mechanical coupling · Monitor and control · Pulse echo measurements · Stability analysis · Standing wave patterns · Time dependent behavior · Thickness measurement
[Abstract]

16 Bacterial deposition to fluoridated and non-fluoridated polyurethane coatings with different elastic modulus and surface tension in a parallel plate and a stagnation point flow chamber
article 2003    
Author: Bakker, D.P. · Huijs, F.M. · Vries, J. de · Klijnstra, J.W. · Busscher, H.J. · Mei, H.C. van der
Keywords: Bacterial deposition · Marine bacteria · Surface tension · Elastic moduli · Hydrophobicity · Polyurethanes · Surface tension · Flow chambers · Organic coatings · Atomic force microscopy · Bioaccumulation · Cell surface · Hydrophilicity · Material coating · Strain difference · Surface property · Surface tension · Bacteria (microorganisms) · Halomonas pacifica · Marinobacter hydrocarbonoclasticus
[Abstract]

17 Characterizing Length Scales that Determine the Mechanical Behavior of gels from Crosslinked Casein Micelles
article 2015    
Author: Nieuwland, M. · Bouwman, W.G. · Bennink, M.L. · Silletti, E. · Jongh, H,H.J. de
Keywords: Nutrition · Atomic force microscopy · Bridging length scales · Casein micelles · Mechanical behavior · Spin echo small angle neutron scattering · Transglutaminase crosslinking · Food and Nutrition · Healthy Living · Life · FI - Functional Ingredients · ELSS - Earth, Life and Social Sciences
[Abstract]

18 Automated cantilever exchange and optical alignment for high-throughput parallel Atomic Force Microscopy
article 2017    
Author: Sadeghian Marnani, H. · Bijnagte, A.A. · Herfst, R.W. · Kramer, G.F.IJ. · Kramer, L. · Dekker, A.
Keywords: Atomic Force Microscopy · AFM · Automated cantilever exchange · Optical alignment · Parallel AFM · NOMI Nano Opto-Mechatronics Instruments Group · High Tech Systems & Materials · Industrial Innovation · 2015 Nano Technology · OM - Opto-Mechatronics · TS - Technical Sciences
[Abstract]

19 Monolayer coverage and channel length set the mobility in self-assembled monolayer field-effect transistors
article 2009    
Author: Mathijssen, S.G.J. · Smits, E.C.P. · Hal, P.A. van · Wondergem, H.J. · Ponomarenko, S.A. · Moser, A. · Resel, R. · Bobbert, P.A. · Kemerink, M. · Janssen, R.A.J. · Leeuw, D.M. de
Keywords: Nanotechnology · article · atomic force microscopy · controlled study · field effect transistor · liquid crystal · priority journal · self assembled monolayer field effect transistor · semiconductor · structure analysis · topography · transmission electron microscopy · X ray diffraction
[Abstract]

20 Introduction of a high throughput SPM for defect inspection and process control
article 2013    
Author: Sadeghian Marnani, H. · Koster, N.B. · Dool, T.C. van den
Keywords: Manufacturing · 450 mm wafer · Atomic force microscopy · Defects inspection · High throughput scanning probe microscopy · Metrology · Process control · High Tech Systems & Materials · Industrial Innovation · Mechatronics, Mechanics & Materials · OM - Opto-Mechatronics · TS - Technical Sciences
[Abstract]

Search results also available in MS Excel format.

Showing 1 to 20 of 32 found. Next | Sort by date