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Showing 1 to 13 of 13 found. | Sort by date

1 An overview of scanning acoustic microscope, a reliable method for non-destructive failure analysis of microelectronic components
article 2015    
Author: Yazdan Mehr, M. · Bahrami, A. · Fischer, H. · Gielen, S. · Corbeij, R. · van Driel, W.D. · Zhang, G.Q.
Keywords: Electronics · Acoustic microscopes · Microelectronics; Microsystems · Nondestructive examination · High Tech Systems & Materials · Industrial Innovation · Nano Technology · MAS - Materials Solutions · TS - Technical Sciences
[Abstract]

2 Prediction of the thermo-mechanical material behavior of PEN foil during photolithographic processing
article 2009    
Author: Barink, M. · Goorhuis, M. · Giesen P. · Furthner, F. · Yakimets, I.
Keywords: Bending behavior · Environmental factors · Flexible substrate · Lithographic process · Lithography process · Loading experiment · Organic materials · Plastic electronics · Thermo-mechanical · Thermomechanical model · Experiments · Lithography · Microelectronics · Microsystems · Plastic products · Simulators · Thermomechanical treatment · Substrates
[Abstract]

3 The electro-thermal-mechanical performance of an OLED : a multi-physics model study
article 2009    
Author: Gielen, A.W.J. · Barink, M. · Brand, J. van de · Mol, A.M.B. van
Keywords: Electronics · Detailed design · Finite Element · Mechanical performance · Model study · Multi-physics · Simulation model · Thermo-mechanical · Three-dimensional model · Two dimensional model · Microelectronics · Microsystems · Organic light emitting diodes (OLED) · Three dimensional · Simulators
[Abstract]

4 Understanding the transport phenomena leading to tarnishing of the reflecting silver layer causing reduced light output of LEDs
article 2017    
Author: Herrmann, A. · Erich, S.J.F. · Ven, L.G.J.V.D. · Driel, W.D. van · Soestbergen, M. van · Mavinkurve, A. · Buyl, F. de · Adan, O.C.G.
Keywords: Materials · Microelectronics · Microsystems · Silver · Color spectra · Failure mechanism · Light output · Luminous flux · Silver layer · Transport phenomena · Light emitting diodes · High Tech Systems & Materials · Industrial Innovation · Nano Technology · MAS - Materials Solutions · TS - Technical Sciences

5 Post-operative wireless implants for monitoring, detection and treatment
article 2011    
Author: Subbaiyan, D. · Pakula, L.S. · French, P.J. · Lange, J.F. · Jeekel, J. · Kleinrensink, G.J. · Sterenborg, H.J.C. · Robinson, D.J. · Zaane, F. van · Kaptein, J.G. · Tang, K. · Pandraud, G. · Veen, J. van · Draaier, M. · Vakalapoulos, K.A.
Keywords: Health · Medical implants · medical sensors PDT · medical treatment · wireless systems · External systems · Flexible substrate · Medical implants · medical sensors PDT · Medical treatment · Read-out data · Wireless communications · Wireless implant · Wireless platform · wireless systems · Actuators · Carbon dioxide · Medical applications · Microsystems · Solid-state sensors · Surgery · Tissue · Wireless telecommunication systems · Monitoring · Life · QS - Quality & Safety · EELS - Earth, Environmental and Life Sciences
[Abstract]

6 Thermo-mechanical challenges in the longevity of micro-electronics
article 2010    
Author: Gielen, A.W.J.
Keywords: Electronics · Accelerated lifetime testing · Acceleration factors · Automotive electronics · Degradation mechanism · Lifetime assessment · Long duration · Mission profile · Operational conditions · Testing conditions · Thermo-mechanical · Automobile parts and equipment · Degradation · Microelectronics · Microsystems · Industrial Innovation · Mechatronics, Mechanics & Materials · MIP - Materials for Integrated Products · TS - Technical Sciences
[Abstract]

7 Modeling the residual shrinkage during lithographic processing on flexible polymer substrates
article 2010    
Author: Barink, M. · Berg, D. van den · Yakimets, I. · Meinders, E.R.
Keywords: Electronics · Accurate prediction · Electronic circuitry · Electronic device · Experimental investigations · Feature sizes · Flexible polymer substrates · Lithographic processing · Modeling approach · Overlay errors · Polymer foil · Production process · Temperature dependent · Visco-elastic material · Deformation · Microelectronics · Microsystems · Polymers · Shrinkage · Substrates · High Tech Systems & Materials · Industrial Innovation · Mechatronics, Mechanics & Materials · HOL - Holst · TS - Technical Sciences
[Abstract]

8 Design, modeling, fabrication and characterization of an electret-based MEMS electrostatic energy harvester
article 2011    
Author: Altena, G. · Hohlfeld, D. · Elfrink, R. · Goedbloed, M.H. · Schaijk, R. van
Keywords: Electret · Electrostatic · Energy harvester · MEMS · SABER · Scavenging · Variable capacitor · Vibration generation · Electromechanical models · Electrostatic energies · Energy harvester · Output current · Process flows · SABER · Self-aligned electrodes · SOI wafers · Variable capacitor · Vibration generation · Actuators · Capacitors · Electrets · Electrostatic actuators · Electrostatic force · Fabrication · Harvesters · Microsystems · Solid-state sensors · Energy harvesting · Industrial Innovation · Mechatronics, Mechanics & Materials · HOL - Holst · TS - Technical Sciences
[Abstract]

9 Comprehensive material characterization and method of its validation by means of FEM simulation
article 2011    
Author: Gromala, P. · Duerr, J. · Dressler, M. · Jansen, K.M.B. · Hawryluk, M. · Vreugd, J. de
Keywords: Bi-material strips · Coefficient of thermal expansion · Copper substrates · Curing shrinkage · FEM simulations · Fringe pattern · Geometrical dimensions · Material characterizations · Material modeling · Material models · Modulus of elasticity · Molding compound · Numerical simulation · Warpages Engineering · Curing · Experiments · Finite element method · Microelectronics · Microsystems · Numerical methods · Product design · Shrinkage Engineering · Thermal expansion · Mechatronics, Mechanics & Materials · OM - Opto-Mechatronics · TS - Technical Sciences
[Abstract]

10 Self-powered optical sensor systems
article 2009    
Author: Wu, H. · Emadi, A. · Graaf, G. de · Leijtens, J.A.P. · Wolffenbuttel, R.F.
Keywords: Electronics · Energy scavenging · Optical system · Photodiode · Self-powering · Sun sensor · Angle of Incidence · CMOS processs · Electrical power generation · Energy scavenging · Incoming light · Low Power · On-chip integration · Optical position measurements · Photodiode arrays · Self-powered · Self-powering · Sun sensor · Supply voltages · Test structure · Voltage amplifiers · Actuators · Microsystems · Optical sensors · Optical systems · Photocurrents · Photodiodes · Piezoelectric transducers · Position measurement · Sun · Voltage regulators · Solid-state sensors
[Abstract]

11 Optical and thermal simulation chain for LED package
article 2016    
Author: Tapaninen, O. · Myohanen, P. · Majanen, M. · Sitomaniemi, A. · Olkkonen, J. · Hildenbrand, V. · Gielen, A.W.J. · Mackenzie, F.V. · Barink, M. · Smilauer, V. · Patzak, B.
Keywords: Vision Electronics · Computer programming · Microelectronics · Microsystems · Open source software · Open systems · Comsol multiphysics · Multi-physics modelling · Open source platforms · Open sources · Optical simulation · Physical aspects · Python programming language · Thermal simulations · Computer software · Industrial Innovation · Nano Technology · MAS - Materials Solutions · TS - Technical Sciences
[Abstract]

12 On-line monitoring of electrolytes in hemodialysis: on the road towards individualizing treatment
article 2016    
Author: Sharma, M.K. · Wieringa, F.P. · Frijns, A.J.H. · Kooman, J.P.
Keywords: Health · Conductivity · Dialysis · Dialysis dose · Electrolyte balance · Optical sensor · Urea monitors · Blood pressure · Electric conductivity · Electrolytes · Hemodialyzers · Metabolism · Microfluidics · Microsystems · Optical sensors · Toxic materials · Voltage measurement · Blood volumes · Co morbidities · Dialysates · End-stage renal disease patients · In-line monitoring · Online monitoring · Selective sensing · Waste products · High Tech Systems & Materials · Industrial Innovation · Nano Technology · OPT - Optics · TS - Technical Sciences
[Abstract]

13 Local stress analysis in devices by FIB
article 2010    
Author: Kregting, R. · Gielen, A.W.J. · Driel, W. van · Alkemade, P. · Miro, H. · Kamminga, J.-D.
Keywords: Materials · Bond pad · Digital image correlations · Early failure · FE model · FIB milling · Finite elements · Gold layer · In-plane displacement · Intrinsic stress · Local stress analysis · Nano meter range · Power lines · Scanning electron microscopes · SEM image · Semiconductor structure · Small Hole · Strain gauge · Gages · Gold coatings · Microsystems · Milling (machining) · Plant shutdowns · Scanning electron microscopy · Stress analysis · Microelectronics · High Tech Systems & Materials · Industrial Innovation · Mechatronics, Mechanics & Materials · MIP - Materials for Integrated Products · TS - Technical Sciences
[Abstract]

Search results also available in MS Excel format.

Showing 1 to 13 of 13 found. | Sort by date