Repository hosted by TU Delft Library

Home · Contact · About · Disclaimer ·
 

Search results also available in MS Excel format.

Showing 1 to 6 of 6 found. | Sort by date

1 Nanometer level freeform surface measurements with the NANOMEFOS non-contact measurement machine
article 2009    
Author: Henselmans, R. · Cacace, L. · Ramer, G. · Rosielle, P.C.J.N. · Steinbuch, M.
Keywords: Instruments · Asphere · Freeform · Measurement · Metrology · NANOMEFOS · Non-contact · Optics · Asphere · Freeform · Metrology · NANOMEFOS · Non-contact · Computer software · Optical systems · Probes · Surface measurement · Uncertainty analysis · Measurements
[PDF] [Abstract]

2 The NANOMEFOS non-contact measurement machine for freeform optics
article 2011    
Author: Henselmans, R. · Cacace, L.A. · Kramer, G.F.Y. · Rosielle, P.C.J.N. · Steinbuch, M.
Keywords: Electronics · Asphere · Freeform optics · Measurement machine · Metrology frame · NANOMEFOS · Non-contact · Mechatronics, Mechanics & Materials · OM - Opto-Mechatronics · TS - Technical Sciences
[Abstract]

3 Manufacturing of high precision aspherical and freeform optics
article 2012    
Author: Hoogstrate, A.M. · Drunen, C. van · Venrooy, B.W.H. van · Henselmans, R.
Keywords: Electronics · Asphere · Freeform · NANOMEFOS · Polishing · SPDT · High Tech Systems & Materials · Industrial Innovation · Mechatronics, Mechanics & Materials Physics & Electronics · IM - Instrurment Manufacturing OPT - Optics · TS - Technical Sciences
[Abstract]

4 Manufacturing of high precision aspherical and freeform optics
article 2012    
Author: Hoogstrate, A.M. · Drunen, C. van · Venrooy, B.W.H. van · Henselmans, R.
Keywords: Electronics · Asphere · Freeform · NANOMEFOS · Polishing · SPDT · High Tech Systems & Materials · Industrial Innovation · Mechatronics, Mechanics & Materials Physics & Electronics · IM - Instrument Manufacturing OPT - Optics · TS - Technical Sciences
[PDF] [Abstract]

5 Design of an E-ELT M1 segment measurement machine with nanometer accuracy
article 2014    
Author: Bos, A. · Henselmans, R. · Rosielle, P.C.J.N. · Steinbuch, M. · Voert, M.J.A. te
Keywords: Electronics · European Extremely Large Telescope (E-ELT) · Giant telescopes · Ground-based astronomy · NANOMEFOS · Non-contact · Segment metrology · Machine design · Optical telescopes · Uncertainty analysis · Measurement machines · High Tech Systems & Materials · Industrial Innovation · Mechanics, Materials and Structures · OM - Opto-Mechatronics · TS - Technical Sciences
[PDF] [Abstract]

6 Nanometre-accurate form measurement machine for E-ELT M1 segments
article 2015    
Author: Bos, A. · Henselmans, R. · Rosielle, P.C.J.N. · Steinbuch, M.
Keywords: Nanotechnology · Giant telescopes · Ground-based astronomy · Large Telescope (E-ELT) · Measurement machines · NANOMEFOS · Non-contact · Segment metrology · Bearings (machine parts) · Machine design · Silicon carbide · Sintered carbides · Sintering · Units of measurement · Uncertainty analysis · High Tech Systems & Materials · Industrial Innovation · Mechanics, Materials and Structures · OM - Opto-Mechatronics · TS - Technical Sciences
[Abstract]

Search results also available in MS Excel format.

Showing 1 to 6 of 6 found. | Sort by date