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1 Real-time NO2 detection at ppb level with ZnO field-effect transistors
article 2013    
Author: Andringa, A.-M. · Smits, E.C.P. · Klootwijk, J.H. · Leeuw, D.M. de
Keywords: Electronics · Dynamic read out · Electron trapping · Field-effect transistor · NO2 sensors · Real-time sensor · Stretched-exponential · Threshold voltage shift · High Tech Systems & Materials · Industrial Innovation · Mechatronics, Mechanics & Materials · HOL - Holst · TS - Technical Sciences
[Abstract]

2 Gate-bias controlled charge trapping as a mechanism for NO2 detection with field-effect transistors
article 2011    
Author: Andringa, A.-M. · Meijboom, J.R. · Smits, E.C.P. · Mathijssen, S.G.J. · Blom, P.W.M. · Leeuw, D.M. de
Keywords: Electronics · air quality sensors · charge trapping · field-effect transistors · NO2 sensors · ZnO · Ambipolar semiconductor · Chemiresistors · Commercial sensors · Detection mechanism · Electron trapping · Exponential time · Gate bias · Human health · Nitrogen dioxides · NO sensors · P-type · Positive gate bias · Sensing mechanism · Threshold voltage shifts · ZnO · Air quality · Bias voltage · Charge trapping · Nitrogen oxides · Sensors · Threshold voltage · Zinc oxide · Field effect transistors · Industrial Innovation · Mechatronics, Mechanics & Materials · HOL - Holst · TS - Technical Sciences
[Abstract]

3 Dynamics of charge carrier trapping in NO 2 sensors based on ZnO field-effect transistors
article 2012    
Author: Andringa, A.-M. · Vlietstra, N. · Smits, E.C.P. · Spijkman, M.-J. · Gomes, H.L. · Klootwijk, J.H. · Blom, P.W.M. · Leeuw, D.M. de
Keywords: Electronics · Activation energy · Charge carrier trapping · Field-effect transistor · NO 2 sensors · Stretched-exponential · Thermally stimulated current · Threshold voltage shift · Analytical description · Characteristic temperature · Charge carrier trapping · De-trapping · Functional dependence · Nitrogen dioxides · Operating temperature · Pressure window · Real time sensors · Sensor response · Stretched-exponential · Temporal behavior · Thermally activated · Thermally stimulated current · Threshold voltage shifts · Time dependence · Trap depth · ZnO · Activation energy · Charge carriers · Charge trapping · Dynamics · Field effect transistors · Optimization · Sensors · Thermoluminescence · Threshold voltage · Zinc oxide · Nitrogen oxides · Industrial Innovation · Mechatronics, Mechanics & Materials · HOL - Holst · TS - Technical Sciences
[Abstract]

Search results also available in MS Excel format.

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