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1 Energy-autonomous wireless vibration sensor for condition-based maintenance of machinery
article 2011    
Author: Wang, Z. · Bouwens, F. · Vullers, R. · Petré, F. · Devos, S.
Keywords: Electronics · Condition based maintenance · Condition-based monitoring · Key feature · Manufacturing industries · Operating condition · Sampling rates · Thermoelectric generators · Wireless measurements · Wireless sensor · Wireless vibration sensors · Machinery · Thermoelectric equipment · Thermoelectricity · Ventilation exhausts · Sensors · High Tech Systems & Materials · Industrial Innovation · Mechatronics, Mechanics & Materials · HOL - Holst · TS - Technical Sciences
[Abstract]

2 A 30fJ/conversion-step 8b 0-to-10MS/s asynchronous SAR ADC in 90nm CMOS
article 2010    
Author: Harpe, P. · Zhou, C. · Wang, X. · Dolmans, G. · Groot, H. de
Keywords: Electronics · 90nm CMOS · Low power application · Low power receiver · Power efficient · Power-efficiency · Sampling rates · SAR ADC · System levels · Wireless sensor node · Electric network synthesis · Sensor nodes · Telecommunication equipment · High Tech Systems & Materials · Industrial Innovation · Mechatronics, Mechanics & Materials · HOL - Holst · TS - Technical Sciences
[Abstract]

3 Compressive sensing for high resolution radar imaging
article 2010    
Author: Anitori, L. · Otten, M.P.G. · Hoogeboom, P.
Keywords: Radar · Compressive sensing · matched filter · Aspect angles · Corner reflector · High resolution · Random selection · Real-time application · Receiver Operating Characteristics (ROC) · Sampling rates · Shannon Sampling Theorem · Sparse signals · Matched filters · Radar imaging · Reflection · Signal reconstruction · Two dimensional · Signal processing · Physics & Electronics · RAD - Radar Technology · TS - Technical Sciences
[Abstract]

4 Interferometry for picometer-level dimensional stability measurements
article 2011    
Author: Voigt, D. · Ellis, J.D. · Verlaan, A.L. · Bergmans, R.H. · Spronck, J.W. · Munnig Schmidt, R.H.
Keywords: Air refractive index · Balanced configurations · Beam path · Close proximity · Common mode rejections · Constructional elements · Contact less · Cost factors · Cycle stability · In-situ · Industrial equipment · Instability events · Measurement uncertainty · Optical heterodyne interferometer · Optical scheme · Recalibrations · Reference beams · Sampling rates · Semiconductor industry · Space missions · Stability measurements · Thermal drifts · Time-scales · Typical samples · Vacuum tube · Zerodur · Bolted joints · Electron optics · Interferometers · Interferometry · Optics · Quantum electronics · Refractive index · Refractometers · Semiconductor device manufacture · Semiconductor lasers · Silicon carbide · Thermal expansion · Uncertainty analysis · Dimensional stability · Physics & Electronics · OPT - Optics · TS - Technical Sciences
[Abstract]

Search results also available in MS Excel format.

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