Repository hosted by TU Delft Library

Home · Contact · About · Disclaimer ·
 

Search results also available in MS Excel format.

Showing 1 to 2 of 2 found. | Sort by date

1 A comprehensive model for transient behavior of tapping mode atomic force microscope
article 2019    
Author: Keyvani, A. · Tamer, M.S. · Wingerden, J.W. van · Goosen, J.F.L. · Keulen, F. van
Keywords: Tapping mode AFM · Transient analysis · Modulated model · Chaos · Speed limit of AFM · Atomic force microscope · Microscopy · High Tech Systems & Materials · Industrial Innovation
[Abstract]

2 Transient Tip-Sample Interactions in High-Speed AFM Imaging of 3D nano structures
article 2015    
Author: Keyvani Janbahan, A. · Sadeghian Marnani, H · Goosen, H. · Keulen, F. van
Keywords: Electronics · Tapping mode AFM · Tip-sample interactions · Peak repulsive Force · Hertz model · Contact stress · High Tech Systems & Materials · Industrial Innovation · Mechatronics, Mechanics & Materials · OM - Opto-Mechatronics · TS - Technical Sciences
[PDF] [Abstract]

Search results also available in MS Excel format.

Showing 1 to 2 of 2 found. | Sort by date