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Showing 1 to 12 of 12 found. | Sort by date

1 Vega interstage strain measurements: comparison between conventional strain gauges and Fibre Bragg Grating sensors
article 2006    
Author: Cheng, L.K. · Ahlers, B.
Keywords: Strain gages · Strain measurement · Conventional sensors · Earth observations · Fibre Bragg Grating sensors · Generation launchers · Load measurements · Monocoque structures · Qualification model · Qualification test · Space & Scientific Instrumentation · Industrial Innovation
[Abstract]

2 Vega interstage multi-parameter measurements using FBG sensor array
article 2006    
Author: Cheng, L.K. · Ahlers, B.
Keywords: Electronics · Generation launchers · Interstage · Multi-parameter measurement · Multiparameters · Qualification test · Temperature monitoring · Electric sensing devices
[Abstract]

3 Nanoparticle detection limits of TNO’s Rapid Nano: modeling and experimental results
article 2012    
Author: Walle, P. van der · Kumar, P. · Ityaksov, D. · Versluis, R. · Maas, D.J. · Kievit, O. · Janssen, J. · Donck, J.C.J. van der
Keywords: Nanotechnology · Particle inspection · EUV · Qualification · Detection limit · Modeling · Rapid Nano · BRDF · Speckle · Physics & Electronics · NI - Nano Instrumentation · TS - Technical Sciences
[PDF] [Abstract]

4 Particle qualification procedure for the TNO EUV reticle load port module of the HamaTech MaskTrackPro cleaning tool
article 2011    
Author: Stortelder, J.K. · Donck, J.C.J. van der · Oostrom, S. · Walle, P. van der · Brux, O. · Dress, P.
Keywords: Physics · EUV reticles · particles · qualification · reticle handling · reticle load port · statistics · Physics & Electronics · NI - Nano Instrumentation · TS - Technical Sciences
[Abstract]

5 Optimized qualification protocol on particle cleanliness for EUV mask infrastructure
article 2011    
Author: Donck, J.C.J. van der · Stortelder, J.K. · Derksen, G.B.
Keywords: Materials · EUV mask infrastructure · Particle cleanliness · Particle qualification · Statistics · Industrial Innovation · Physics & Electronics · NI - Nano Instrumentation ; II - Intelligent Imaging · TS - Technical Sciences
[Abstract]

6 Gaia basic angle monitoring system
article 2013    
Author: Gielesen, W.L.M. · Bruijn, D. de · Dool, T.C. van den · Kamphues, F. · Mekking, J. · Calvel, B. · Laborie, A. · Coatantiec, C. · Touzeau, S. · Erdmann, M. · Gare, P. · Monteiro, D.
Keywords: Electronics · Gaia · Opto-mechanics · Picometer · Metrology · Stability · Silicon Carbide · Cryogenic · Space qualification · High Tech Systems & Materials · Industrial Innovation · Physics & Electronics · SSE - Space Systems Engineering · TS - Technical Sciences
[PDF] [Abstract]

7 Increased particle inspection sensitivity by reduction of background scatter variance
article 2013    
Author: Walle, P. van der · Kumar, P. · Ityaksov, D. · Versluis, R. · Maas, D.J. · Kievit, O. · Janssen, O. · Donck, J.C.J. van der
Keywords: Electronics · Dark-field microscopy · Detection limit · EUVL · Illumination · Particle inspection · Qualification · Rapid Nano · Speckle · High Tech Systems & Materials · Industrial Innovation · Physics & Electronics · NI - Nano Instrumentation · TS - Technical Sciences
[Abstract]

8 Gaia basic angle monitoring system
article 2012    
Author: Gielesen, W.L.M. · Bruijn, D. de · Dool, T.C. van den · Kamphues, F.G. · Meijer, E.A. · Calvel, B. · Laborie, A. · Monteiro, D. · Coatantiec, C. · Touzeau, S. · Erdmann, M. · Gare, P.
Keywords: Electronics · Gaia · Opto-mechanics · picometer · metrology · stability · Silicon Carbide · cryogenic · space qualification · High Tech Systems & Materials · Industrial Innovation · Physics & Electronics · SSE - Space Systems Engineering · TS - Technical Sciences
[PDF] [Abstract]

9 A new star (sensor) is born
article 2017    
Author: Leijtens, J. · Vliegenthart, W. · Lampridis, D. · Vacanti, G. · Monna, B. · Bechthum, E. · Hagenaars, K. · Heide, E. van der · Kruijff, M. · Breukelen, E. van · Lemair, A.
Keywords: Space applications · Attitude control subsytem · Metal housing · Multiple apertures · Netherlands · Pre-qualification · Predicted performance · Production cost · System size · Attitude control · Observation, Weapon & Protection Systems · DSS - Distributed Sensor Systems · TS - Technical Sciences

10 Particle detection on flat surfaces
article 2011    
Author: Donck, J.C.J. van der · Snel, R. · Stortelder, J. · Abutan, A. · Oostrom, S. · Reek, S. van · Zwan, B. van der · Walle, P. van der
Keywords: Physics · EUV reticles · particle detection · qualification · Rapid Nano · reticle inspection · High Tech Systems & Materials · Industrial Innovation · Physics & Electronics Mechatronics, Mechanics & Materials · NI - Nano Instrumentation OM - Opto-Mechatronics IM - Instrument Manufacturing · TS - Technical Sciences
[PDF] [Abstract]

11 Dynamic testing of primary mirror segment supports for the Extremely Large Telescope
article 2018    
Author: Witvoet, G. · Nijenhuis, J.R. · Kramer, L.
Keywords: ELT · Segment support · Airborne telescopes · Dynamic analysis · Frequency response · Machine design · Mechanisms · Optical telescopes · Optical testing · Rigid structures · Extremely Large Telescopes · Primary mirror segments · Qualification model · Scientific researches · Segmented primary mirrors · Strategic locations · Structural design · High Tech Systems & Materials · Industrial Innovation
[Abstract]

12 Cool gas micropropulsion system for cubesats
article 2009    
Author: Breukelen, E. van · Sanders, B.H. · Schuurbiers, C.A.H.
Keywords: Aviation · Basic systems · Commercial off-the-shelf systems · Cubesat · Flexible system · Flight demonstration · Maneuvering capability · Micro propulsion system · Micro-propulsion systems · Microsatellites · Nanosatellite · Netherlands · Nitrogen propellant · On orbit · Plug-and-play · Propulsion system · Qualification model · Standard module · Standardized interfaces · System description · Gas generators · Philosophical aspects · Propellants · Spacecraft propulsion · Gases
[Abstract]

Search results also available in MS Excel format.

Showing 1 to 12 of 12 found. | Sort by date