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1 A comprehensive model for transient behavior of tapping mode atomic force microscope
article 2019    
Author: Keyvani, A. · Tamer, M.S. · Wingerden, J.W. van · Goosen, J.F.L. · Keulen, F. van
Keywords: Tapping mode AFM · Transient analysis · Modulated model · Chaos · Speed limit of AFM · Atomic force microscope · Microscopy · High Tech Systems & Materials · Industrial Innovation
[Abstract]

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