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An on-chip three-port interferometer for metrology and Fiber Bragg Grating interrogation

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Author: Harmsma, P.J. · Cheng, L.K. · Lo Cascio, D.M.R. · Yousefi, M.
Type:article
Date:2011
Source:Proceedings MicroNano Conference, Ede, The Netherlands, 15-16 November, 2011
Identifier: 462839
Keywords: Electronics · Industrial Innovation · Physics & Electronics · OPT - Optics · TS - Technical Sciences