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Tangram: Model-based integration and testing of complex high-tech systems : A collaborative research project on multidisciplinary integration and testing of embedded systems

Author: Tretmans, J.
Publisher: Embedded Systems Institute
Place: Eindhoven
Institution: TNO Industrie en Techniek
Identifier: 521522
ISBN: 978-90-78679-02-8
Keywords: Informatics Science · System engineering · Modeling · Integration · Testing · Embedded systems · Multidisciplinarity · Information Society