Repository hosted by TU Delft Library

Home · Contact · About · Disclaimer ·
 

Adhesion experiments using an AFM-Parameters of influence

Publication files not online:

Author: Dos Santos Ferreira, O. · Gelinck, E.R.M. · Graaf, D. de · Fischer, H.
Type:article
Date:2010
Institution: TNO Industrie en Techniek
Source:Applied Surface Science, 1, 257, 48-55
Identifier: 409287
doi: DOI:10.1016/j.apsusc.2010.06.031
Keywords: Electronics · Abrasion tip · Adhesion · AFM · Contact area · Contact time · FIB · Tip modification · Adhesion forces · Adhesion measurement · AFM · Contact areas · Contact forces · Contact time · Experimental protocols · Quantitative result · Abrasion · Atomic force microscopy · Materials testing · Tribology · Adhesion

Abstract

Adhesion measurements were performed by AFM (Atomic Force Microscopy). It was shown that many parameters need to be controlled in order to provide reproducible and quantitative results. Adhesion forces were shown to depend on combination of materials characteristics and testing geometry as well as experimental protocol (contact time, contact force and contact area). This contact area was modified by means of FIB (Focused Ion Beam) milling and deliberate abrasion. As a result, a drastic change in adhesion could be observed. Still, those are problems connected to adjustment of interacting surfaces. © 2010 Elsevier B.V. All rights reserved.